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350 results:
141. Helmholtz Symposium with the awarding of the Helmholtz Prize  
Date: 04.12.2018
Percental score: 13 %
24 June 2014, Haus der Wissenschaft, Braunschweig. Lectures: (in German) Röntgen – A discovery that changed the world (Uwe Busch, Deutsches Röntgen-Museum, Remscheid) Research with synchrotron  
142. Awards  
Date: 04.12.2018
Percental score: 10 %
Ernst O. Göbel PTB's previous president has received the “DIN Ehrenring” (Ring of Honour) – the highest award granted by the Deutsches Institut für Normung (DIN, German Institute of  
143. Confirmation of the results obtained in the mass determination of the 28Si spheres AVO28-S5c and AVO28-S8c in 2013 and 2014  
Date: 24.10.2018
Percental score: 6 %
Within the scope of comparison measurements with regard to the results of the determination of the Avogadro constant and the Planck constant with the aid of the first two monocrystalline silicon  
144. Reference-free X-Ray Fluorescence analysis (XRF)  
Date: 02.10.2018
Percental score: 16 %
Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
145. Grazing incidence X-Ray Fluorescence (GIXRF)  
Date: 02.10.2018
Percental score: 17 %
Grazing incidence X-Ray Fluorescence (GIXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
146. Total reflection X-Ray Fluorescence (TXRF)  
Date: 02.10.2018
Percental score: 17 %
Total reflection X-Ray Fluorescence (TXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
147. High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA)  
Date: 02.10.2018
Percental score: 15 %
High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
148. X-ray absorption fine structure spectroscopy (XAFS)  
Date: 02.10.2018
Percental score: 16 %
X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
149. Determination of atomic fundamental parameters  
Date: 02.10.2018
Percental score: 17 %
Determination of atomic fundamental parameters Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
150. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
Date: 02.10.2018
Percental score: 16 %
Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
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