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354 results:
131. Reference-free X-Ray Fluorescence analysis (XRF)  
Date: 02.10.2018
Percental score: 16 %
Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
132. Grazing incidence X-Ray Fluorescence (GIXRF)  
Date: 02.10.2018
Percental score: 17 %
Grazing incidence X-Ray Fluorescence (GIXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
133. Total reflection X-Ray Fluorescence (TXRF)  
Date: 02.10.2018
Percental score: 17 %
Total reflection X-Ray Fluorescence (TXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
134. High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA)  
Date: 02.10.2018
Percental score: 16 %
High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
135. X-ray absorption fine structure spectroscopy (XAFS)  
Date: 02.10.2018
Percental score: 16 %
X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
136. Determination of atomic fundamental parameters  
Date: 02.10.2018
Percental score: 17 %
Determination of atomic fundamental parameters Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
137. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
Date: 02.10.2018
Percental score: 16 %
Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
138. Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy  
Date: 02.10.2018
Percental score: 15 %
Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
139. THz Activities  
Date: 02.10.2018
Percental score: 18 %
THz Activities Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030) 3481-7170  
140. European X-ray Spectrometry Association Prizes for PTB Scientists  
Date: 15.08.2018
Percental score: 12 %
Since 2006, the European X-Ray Spectrometry Association (EXSA) has awarded prizes for excellent work in the field of x-ray spectrometry and, since 2010, additionally for the best dissertation in  
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