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71. Transmissionsmodus im REM (TSEM, STEM-in-SEM)
Date: 25.09.2023
Percental score: 12 %

Transmissionsmodus im REM (TSEM, STEM-in-SEM) Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531)
72. Monte Carlo methods for simulating image contrast in SEM
Date: 27.09.2023
Percental score: 12 %

Monte Carlo methods for simulating image contrast in SEM Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee
73. Modular Monte Carlo simulation program
Date: 25.09.2023
Percental score: 12 %

Modular Monte Carlo simulation program Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205
74. 273rd PTB Seminar
Date: 25.11.2013
Percental score: 12 %

The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof
75. High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA)
Date: 02.10.2018
Percental score: 12 %

High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße
76. Transmissionsmodus im REM (TSEM, STEM-in-SEM)
Date: 25.09.2023
Percental score: 12 %

Transmissionsmodus im REM (TSEM, STEM-in-SEM) Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205
77. Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy
Date: 02.10.2018
Percental score: 12 %

Scattering Type Scanning Near-field Optical Microscopy and Nano-FTIR Spectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße
78. Monte Carlo methods for simulating image contrast in SEM
Date: 27.09.2023
Percental score: 11 %

Monte Carlo methods for simulating image contrast in SEM Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531)
79. Devices
Date: 22.04.2016
Percental score: 11 %

In addition to the numerous measurement devices that Working Group 6.25 has for calibrating secondary standards by means of industrial X-ray tubes, this Working Group also has access to various
80. EURADOS Course on Unfolding of Bonner Sphere Spectrometer Neutron Measurements
Date: 21.12.2022
Percental score: 10 %

Bonner sphere spectrometers (BSS) are widely used for neutron spectrometry at reactors, accelerators, and medical facilities. The analysis of the data requires unfolding methods, which need to

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