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61. 4.24 Asphere Metrology
Date: 27.10.2023
Percental score: 52 %

Aspherical optical elements (in short: aspheres), such as aspherical lenses, have surface forms that deviate from a spherical shape. This can reduce imaging errors and – at the same time – produce
62. 5.24 Electron Microscopy
Date: 05.10.2023
Percental score: 74 %

5.24 Electron Microscopy Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531) 592-5240
63. 5.24 Electron Microscopy
Date: 05.10.2023
Percental score: 72 %

5.24 Electron Microscopy Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205
64. 7.24 X-ray Spectrometry
Date: 10.01.2022
Percental score: 74 %

7.24 X-ray Spectrometry Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030) 3481-7170
65. 8.24 Ultra-Low Field MR Imaging
Date: 19.09.2023
Percental score: 52 %

Magnetic resonance imaging (MRI) under extremely low magnetic fields opens up a new range of possibilities to gain insight into chemical and physical phenomena. The PTB supports the area of
66. 8.24 Ultra-Low Field MR Imaging
Date: 19.09.2023
Percental score: 70 %

8.24 Ultra-Low Field MR Imaging Dr. Rainer Körber Physikalisch-Technische Bundesanstalt 8.24 MR Bildgebung im Niedrigfeld Abbestraße 2–12 10587 Berlin rainer.koerber@ptb.de (030) 3481-7576
67. 8.44 Machine Learning and Uncertainty
Date: 04.04.2024
Percental score: 4 %

Examples Bayesian concentration estimation from ELISA measurements Magnetic field fluctuation thermometry Analysis of event-related brain signals Analysis of in-vivo spectra Topics Measurement
68. 8.52 Embedded Metrological Systems
Date: 23.06.2023
Percental score: 2 %

Continuation Public-Key Infrastructure for Smart Meters using Blockchains; Melo, Wilson; Machado, Rafael; Peters, Daniel; Moni, Mahbuba; IEEE International Workshop on Metrology for Industry 4.0
69. 842 Dynamik Diss Eichstaedt
Date: 15.03.2012
Percental score: 1 %

842 Dynamik Diss Eichstaedt Analysis of Dynamic Measurements - Evaluation of dynamic measurement uncertainty vorgelegt von Diplom-Mathematiker Sascha Eichstädt Frankenberg/Hainichen Von der
70. 842_dynamik_Sensors_2010_10_7621
Date: 11.10.2010
Percental score: 3 %

The compensation of LTI systems and the evaluation of the according uncertainty is of growing interest in metrology. Uncertainty evaluation in metrology ought to follow specific guidelines, and

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