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359 results:
131. Dates  
Date: 04.12.2018
Percental score: 8 %
12 September 2013 Informative meeting for the sound test centres members of the Verband der Materialprüfungsanstalten (VMPA) 08:00 o'clock until 18:00 o'clock, PTB Braunschweig, Auditorium Contact:  
132. Helmholtz Prize 2014  
Date: 04.12.2018
Percental score: 9 %
With the Helmholtz Prize, outstanding scientific and technical research work in the field of metrology has been honoured since 1973. It is awarded in the field of precision measurements in physics,  
133. New method for the measurement of structure widths with atomic resolution  
Date: 04.12.2018
Percental score: 5 %
Especially interesting for the semiconductor industry micro- and nano-metrology With a reference method developed at PTB, the dimensions of nanostructures (e.g. on semiconductor chips)  
134. News from the EMRP  
Date: 04.12.2018
Percental score: 8 %
Project meeting of the European Metrology Research Programme (EMRP) with PTB coordination and/or significant contribution of PTB (sometimes only partly public – if you are interested, do not  
135. Helmholtz Symposium with the awarding of the Helmholtz Prize  
Date: 04.12.2018
Percental score: 11 %
24 June 2014, Haus der Wissenschaft, Braunschweig. Lectures: (in German) Röntgen – A discovery that changed the world (Uwe Busch, Deutsches Röntgen-Museum, Remscheid) Research with synchrotron  
136. Awards  
Date: 04.12.2018
Percental score: 8 %
Ernst O. Göbel PTB's previous president has received the “DIN Ehrenring” (Ring of Honour) – the highest award granted by the Deutsches Institut für Normung (DIN, German Institute of  
137. Confirmation of the results obtained in the mass determination of the 28Si spheres AVO28-S5c and AVO28-S8c in 2013 and 2014  
Date: 24.10.2018
Percental score: 5 %
Within the scope of comparison measurements with regard to the results of the determination of the Avogadro constant and the Planck constant with the aid of the first two monocrystalline silicon  
138. Reference-free X-Ray Fluorescence analysis (XRF)  
Date: 02.10.2018
Percental score: 13 %
Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
139. Grazing incidence X-Ray Fluorescence (GIXRF)  
Date: 02.10.2018
Percental score: 14 %
Grazing incidence X-Ray Fluorescence (GIXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
140. Total reflection X-Ray Fluorescence (TXRF)  
Date: 02.10.2018
Percental score: 14 %
Total reflection X-Ray Fluorescence (TXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
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