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61. Total reflection X-Ray Fluorescence (TXRF)
Date: 02.10.2018
Percental score: 13 %

Total reflection X-Ray Fluorescence (TXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)
62. Modeling Scanning Microscopy
Date: 05.10.2023
Percental score: 13 %

Modeling Scanning Microscopy Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205
63. Ausstattung zur Probenpräparation
Date: 27.09.2023
Percental score: 13 %

Ausstattung zur Probenpräparation Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205
64. Vorteile des Transmissionsmodes
Date: 25.09.2023
Percental score: 13 %

Vorteile des Transmissionsmodes Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205
65. Workshop "The Quantum Revolution in Metrology"
Date: 28.11.2017
Percental score: 13 %

The revised International System of Units, the SI, will rest on seven defining constants. To realize the SI units based on the defining constants, methods of quantum metrology will be used in many
66. New Testing Instructions for instruments for measuring the carbon dioxide content in fuel gases
Date: 06.11.1998
Percental score: 12 %

Instruments which measure the carbon dioxide content in fuel gases combined, with volume correctors, serve to determine the compressibility coefficient of fuel gases in accordance with procedures
67. Dose measurement during prostate cancer treatment
Date: 09.06.2009
Percental score: 12 %

During radiation therapy, the physicians try to keep the dose in the tumour as high as possible to destroy as many cancer cells as possible. To avoid the damaging of healthy tissue, it is becoming
68. Reference-free X-Ray Fluorescence analysis (XRF)
Date: 02.10.2018
Percental score: 12 %

Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)
69. X-ray absorption fine structure spectroscopy (XAFS)
Date: 02.10.2018
Percental score: 12 %

X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)
70. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy
Date: 02.10.2018
Percental score: 12 %

Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße

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