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448 results:
  • 61. Modeling Scanning Microscopy  
    Date: 05.10.2023
    Percental score: 13 %
    Modeling Scanning Microscopy Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
  • 62. Ausstattung zur Probenpräparation  
    Date: 27.09.2023
    Percental score: 13 %
    Ausstattung zur Probenpräparation Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
  • 63. Vorteile des Transmissionsmodes  
    Date: 25.09.2023
    Percental score: 13 %
    Vorteile des Transmissionsmodes Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
  • 64. New Testing Instructions for instruments for measuring the carbon dioxide content in fuel gases  
    Date: 06.11.1998
    Percental score: 13 %
    Instruments which measure the carbon dioxide content in fuel gases combined, with volume correctors, serve to determine the compressibility coefficient of fuel gases in accordance with procedures  
  • 65. Dose measurement during prostate cancer treatment  
    Date: 09.06.2009
    Percental score: 13 %
    During radiation therapy, the physicians try to keep the dose in the tumour as high as possible to destroy as many cancer cells as possible. To avoid the damaging of healthy tissue, it is becoming  
  • 66. Reference-free X-Ray Fluorescence analysis (XRF)  
    Date: 02.10.2018
    Percental score: 13 %
    Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
  • 67. X-ray absorption fine structure spectroscopy (XAFS)  
    Date: 02.10.2018
    Percental score: 13 %
    X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
  • 68. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
    Date: 02.10.2018
    Percental score: 13 %
    Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
  • 69. Transmissionsmodus im REM (TSEM, STEM-in-SEM)  
    Date: 25.09.2023
    Percental score: 13 %
    Transmissionsmodus im REM (TSEM, STEM-in-SEM) Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531)  
  • 70. Monte Carlo methods for simulating image contrast in SEM  
    Date: 27.09.2023
    Percental score: 13 %
    Monte Carlo methods for simulating image contrast in SEM Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee  
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