Logo of the Physikalisch-Technische Bundesanstalt

Search

Search result

355 results:
21. 2022 04 26 R Behrens Calibrations in new ICRU quantitites  
Date: 02.05.2022
Percental score: 2 %
2022 04 26 R Behrens Calibrations in new ICRU quantitites Calibrations and irradiations in terms of the newly proposed ICRU operational quantities for radiation protection in photon and beta  
22. 273rd PTB Seminar  
Date: 25.11.2013
Percental score: 13 %
The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof  
23. 2 Ss-OWi 1041 Grundsatzentscheidung  
Date: 18.12.2014
Percental score: 3 %
2 Ss-OWi 1041 Grundsatzentscheidung 2 Ss-OWi 1041/14 (45 a OWi – 204 Js 9104/13 AG Friedberg) OBERLANDESGERICHT FRANKFURT AM MAIN BESCHLUSS In der  
24. 3D nano-metrology with X-ray fluorescence and scattering techniques  
Date: 03.03.2020
Percental score: 10 %
A new algorithm allows the fast reconstruction of atom distributions in 3D nanostructured surfaces Over the last years, PTB has developed a new method for atom-specific reconstruction of  
25. 4.21 Form and Wavefront Metrology  
Date: 03.06.2020
Percental score: 7 %
Selected publications The working group offers the following calibrations: Sphericity and radius measurement of sperical sections Refractive index measurement Transmission measurement on  
26. 4.23 Optical Nanometrology  
Date: 20.01.2021
Percental score: 4 %
Overview on standards for nanometrology   http://www.nanoscale.ptb.de/nanoscale/nanoscale-standards.html http://www.nano-refmat.bam.de/en/ Linewidth calibrations on photomasks are offered  
27. 4.24 Asphere Metrology  
Date: 25.05.2020
Percental score: 80 %
4.24 Asphere Metrology Dr.-Ing. Ines Fortmeier Physikalisch-Technische Bundesanstalt 4.24 Asphärenmetrologie Bundesallee 100 38116 Braunschweig ines.fortmeier@ptb.de (0531) 592-4240  
28. 4.24 Asphere Metrology  
Date: 25.05.2020
Percental score: 57 %
Development of a traceable metrology system for the form measurement of aspheres with very low measurement uncertainty based on the tilted-wave interferometer Further development of the measuring  
29. 5.24 Electron Microscopy  
Date: 08.03.2019
Percental score: 80 %
5.24 Electron Microscopy Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531) 592-5240  
30. 5.24 Electron Microscopy  
Date: 08.03.2019
Percental score: 78 %
5.24 Electron Microscopy Iris Weidner Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie 38116 Braunschweig iris.weidner@ptb.de (0531) 592-5201 (0531) 592-5205  
###SPINNER###
Search results 21 until 30 of 355
The search query was processed in 194 ms.

Search behavior

In the search, the following parameters can be used:

  • "": Phrase search. The words you entered must occur exactly as entered in the search results. Example: "Metrological Services"
  • -: NOT operation. A word can not appear in the search results. Example: "Metrological Services" -"Verification Act"
  • *: Substring search. Example: "Metrological Services" measure* finds "Metrological Services" measures and "Metrological Services" measurement

If you enter more than one search term, the individual words are connected with an "AND".