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461 results:
  • 51. 2019 Thielking Nature556  
    Date: 01.07.2019
    Percental score: 1 %
    2019 Thielking Nature556 Nature 556, 321-325 (2018) https://doi.org/10.1038/s41586-018-0011-8 Laser spectroscopic characterization of the nuclear clock isomer 229mTh Johannes Thielking1, Maxim V.  
  • 52. 2019 UNIDO OIML CS online  
    Date: 12.06.2019
    Percental score: 1 %
    2019 UNIDO OIML CS online CERTIFICATION OF MEASURING INSTRUMENTS 1 1 ACKNOWLEDGMENTS UNIDO gratefully acknowledges the dedicated work of Mr. Paul Dixon (OIML) and Mr. Grégory Glas (BEIS-UK),  
  • 53. 24th IMEKO World Congress  
    Date: 16.06.2023
    Percental score: 68 %
    24th IMEKO World Congress Christine Werner Physikalisch-Technische Bundesanstalt Bundesallee 100 38116 Braunschweig christine.werner@ptb.de (0531) 592-3007  
  • 54. 24th IMEKO World Congress  
    Date: 16.06.2023
    Percental score: 67 %
    24th IMEKO World Congress Karin Conring Physikalisch-Technische Bundesanstalt Bundesallee 100 38116 Braunschweig karin.conring@ptb.de (0531) 592-3006 (0531) 592-3008  
  • 55. 273rd PTB Seminar  
    Date: 25.11.2013
    Percental score: 12 %
    The 273rd PTB Seminar "VUV and EUV Metrology" was held in the Lecture Hall of the Helmholtz-Zentrum Berlin at the electron storage ring BESSY II in Berlin-Adlershof  
  • 56. 2 Ss-OWi 1041 Grundsatzentscheidung  
    Date: 18.12.2014
    Percental score: 3 %
    2 Ss-OWi 1041 Grundsatzentscheidung 2 Ss-OWi 1041/14 (45 a OWi – 204 Js 9104/13 AG Friedberg) OBERLANDESGERICHT FRANKFURT AM MAIN BESCHLUSS In der  
  • 57. 3D nano-metrology with X-ray fluorescence and scattering techniques  
    Date: 03.03.2020
    Percental score: 9 %
    A new algorithm allows the fast reconstruction of atom distributions in 3D nanostructured surfaces Over the last years, PTB has developed a new method for atom-specific reconstruction of  
  • 58. 4.21 Form and Wavefront Metrology  
    Date: 03.06.2020
    Percental score: 7 %
    Our working group develops and applies measurement technologies for optical systems for measurements with the smallest possible measurement uncertainty. We determine form measurement with quantities  
  • 59. 4.23 Optical Nanometrology  
    Date: 20.01.2021
    Percental score: 4 %
    Overview on standards for nanometrology   http://www.nanoscale.ptb.de/nanoscale/nanoscale-standards.html http://www.nano-refmat.bam.de/en/ Linewidth calibrations on photomasks are offered  
  • 60. 4.24 Asphere Metrology  
    Date: 27.10.2023
    Percental score: 75 %
    4.24 Asphere Metrology Dr.-Ing. Ines Fortmeier Physikalisch-Technische Bundesanstalt 4.24 Asphärenmetrologie Bundesallee 100 38116 Braunschweig ines.fortmeier@ptb.de (0531) 592-4240  
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