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372 results:
41. Grazing incidence X-Ray Fluorescence (GIXRF)  
Date: 02.10.2018
Percental score: 14 %
Grazing incidence X-Ray Fluorescence (GIXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
42. Total reflection X-Ray Fluorescence (TXRF)  
Date: 02.10.2018
Percental score: 14 %
Total reflection X-Ray Fluorescence (TXRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
43. Modular Monte Carlo simulation program  
Date: 29.03.2016
Percental score: 14 %
Modular Monte Carlo simulation program Dr. Tobias Klein Physikalisch-Technische Bundesanstalt 5.24 Elektronenmikroskopie Bundesallee 100 38116 Braunschweig tobias.klein@ptb.de (0531) 592-5240  
44. Workshop "The Quantum Revolution in Metrology"  
Date: 28.11.2017
Percental score: 14 %
The revised International System of Units, the SI, will rest on seven defining constants. To realize the SI units based on the defining constants, methods of quantum metrology will be used in many  
45. New Testing Instructions for instruments for measuring the carbon dioxide content in fuel gases  
Date: 06.11.1998
Percental score: 13 %
Instruments which measure the carbon dioxide content in fuel gases combined, with volume correctors, serve to determine the compressibility coefficient of fuel gases in accordance with procedures  
46. Dose measurement during prostate cancer treatment  
Date: 09.06.2009
Percental score: 13 %
During radiation therapy, the physicians try to keep the dose in the tumour as high as possible to destroy as many cancer cells as possible. To avoid the damaging of healthy tissue, it is becoming  
47. Publications (Department 6.2)  
Date: 29.03.2016
Percental score: 13 %
Department 6.2 Working Group 6.21 Working Group 6.22 Working Group 6.24 Working Group 6.25  
48. Reference-free X-Ray Fluorescence analysis (XRF)  
Date: 02.10.2018
Percental score: 13 %
Reference-free X-Ray Fluorescence analysis (XRF) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
49. X-ray absorption fine structure spectroscopy (XAFS)  
Date: 02.10.2018
Percental score: 13 %
X-ray absorption fine structure spectroscopy (XAFS) Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße 2–12 10587 Berlin burkhard.beckhoff@ptb.de (030)  
50. Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy  
Date: 02.10.2018
Percental score: 13 %
Farfield Fourier Transform Infrared (FTIR)-Microspectroscopy Dr. Burkhard Beckhoff Physikalisch-Technische Bundesanstalt 7.24 Röntgenspektrometrie Abbestraße  
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