Publikations Einzelansicht
Artikel
| Titel: | Application of Bayesian model averaging to the determination of thermal expansion of single-crystal silicon |
|---|---|
| Autor(en): | J. Martin, G. Bartl and C. Elster |
| Journal: | Measurement Science and Technology |
| Jahr: | 2019 |
| Band: | 30 |
| Seite(n): | 045012 |
| DOI: | 10.1088/1361-6501/ab094b |
| Marker: | 8.4,8.42,Unsicherheit,Regression |