The optical industry uses aspheres and free-form surfaces in modern optical systems, which, however, place very high demands on metrology. Optical measurement techniques have a prominent role to play here, as they do not damage the measurement objects. The industry urgently needs traceability in optical asphere/free form metrology, which is not yet available with the demanded accuracy. Further research projects can therefore be expected with respect to aspherical and free-form metrology development at the international level.
