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Analysis of key comparisons

Working Group 8.42

Overview

Key comparisons are interlaboratory comparisons carried out regularly between National Metrology Institutes (NMIs) within the framework of the CIPM Mutual Recognition Arrangement (Opens external link in new windowMRA). Key comparisons enable the mutual recognition of calibrations, measurements, and test certificates of the NMIs and mark a major step in supporting international trade, commerce and regulatory affairs. The final report and the supporting technical data of each key comparison are stored and made publicly available at the key comparison data base  Opens external link in new windowKCDB of the Bureau International des Poids et Mesures (Opens external link in new windowBIPM). Fig. 1 shows a typical example of key comparison data.

Fig.1 Example data of a key comparison along with the key comparison reference value (KCRV). The blue results indicate control measurements made by the so-called pilot laboratory.

Research

The analysis of key comparisons can be seen as a Opens external link in new windowMeta-Analysis in which the results reported by the participating laboratories are assessed. Fixed effects or random effects models are popular models applied in meta-analysis. One focus of research of PTB’s Working Group 8.42 is the development of Bayesian methods for the estimation of fixed and random effects models. This includes the assignment of vaguely informative or appropriate non-informative priors and the exploration of the properties of the resulting inference. Other topics of research are situations in which the common measurand shows a drift, or where the explanatory power of key comparisons is assessed in dependence on the stability of the common measurand and the uncertainties reported by the participating laboratories.

Software

Publications

G. Wübbeler, H. Bettin, F. Härtig and C. Elster
Metrologia, 55(5),
722,
2018.
R. Schachtschneider, I. Fortmeier, M. Stavridis, J. Asfour, G. Berger, R. B. Bergmann, A. Beutler, T. Blümel, H. Klawitter, K. Kubo, J. Liebl, F. Löffler, R. Meeß, C. Pruss, D. Ramm, M. Sandner, G. Schneider, M. Wendel, I. Widdershoven, M. Schulz and C. Elster
Measurement Science and Technology, 29(5),
055010,
2018.
O. Bodnar and C. Elster
AStA Advances in Statistical Analysis, 102(1),
1--20,
2018.
O. Bodnar, A. Link, B. Arendacká, A. Possolo and C. Elster
Statistics in Medicine, 39(2),
378--399,
2017.
J. Wright, B. Toman, B. Mickan, G. Wübbeler, O. Bodnar and C. Elster
Metrologia, 53(6),
1243,
2016.
G. Wübbeler, O. Bodnar and C. Elster
Metrologia, 53(4),
1131--1138,
2016.
G. Wübbeler, O. Bodnar, B. Mickan and C. Elster
Metrologia, 52(2),
400--405,
2015.
L. Spinelli, M. Botwicz, N. Zolek, M. Kacprzak, D. Milej, P. Sawosz, A. Liebert, U. Weigel, T. Durduran, F. Foschum, A. Kienle, F. Baribeau, S. Leclair, J.-P. Bouchard, I. Noiseux, P. Gallant, O. Mermut, A. Farina, A. Pifferi, A. Torricelli, R. Cubeddu, H.-C. Ho, M. Mazurenka, H. Wabnitz, K. Klauenberg, O. Bodnar, C. Elster, M. Bénazech-Lavoué, Y. Bérubé-Lauzière, F. Lesage, D. Khoptyar, A. A. Subash, S. Andersson-Engels, P. Di Ninni, F. Martelli and G. Zaccanti
Biomedical optics express, 5(7),
2037--53,
2014.
O. Bodnar and C. Elster
Metrologia, 51(5),
516--521,
2014.
K. Jousten, K. Arai, U. Becker, O. Bodnar, F. Boineau, J. A. Fedchak, V. Gorobey, W. Jian, D. Mari, P. Mohan, J. Setina, B. Toman, M. Vivcar and Y. H. Yan
Metrologia, 50(1A),
07001--07001,
2013.
O. Bodnar, A. Link, K. Klauenberg, K. Jousten and C. Elster
Measurement Techniques, 56(6),
584--590,
2013.
C. Elster and B. Toman
Metrologia, 50(5),
549--555,
2013.
I. Lira, A. G. Chunovkina, C. Elster and W. Wöger
IEEE Transactions on Instrumentation and Measurement, 61(8),
2079--2084,
2012.
B. Toman, J. Fischer and C. Elster
Metrologia, 49(4),
567--571,
2012.
C. Elster and B. Toman
Metrologia, 47(3),
113--119,
2010.
C. Elster, A. G. Chunovkina and W. Wöger
Metrologia, 47(1),
96--102,
2010.
A. G. Chunovkina, C. Elster, I. Lira and W. Wöger
Measurement Techniques, 52(7),
788--793,
2009.
A. G. Chunovkina, C. Elster, I. Lira and W. Wöger
Metrologia, 45(2),
211--216,
2008.
H.-J. von Martens, C. Elster, A. Link, A. Täubner and T. Bruns
Metrologia, 43(1A),
09002-09002,
2006.
C. Elster, W. Wöger and M. G. Cox
Measurement Techniques, 48(9),
883--893,
2005.
H.-J. von Martens, C. Elster, A. Link, W. Wöger and P. J Allisy
Metrologia, 41(1A),
09002,
2004.
C. Elster, A. Link and W. Wöger
Metrologia, 40(4),
189,
2003.
C. Elster, A. Link and H.-J. von Martens
Measurement Science and Technology, 12(10),
1672,
2001.
C. Elster and A. Link
Measurement Science and Technology, 12(9),
1431,
2001.
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