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Analysis of dynamic measurements

Working Group 8.42

Overview

Dynamic measurements can be found in many areas of metrology and industry such as, for instance, in the measurement of time-dependent forces or accelerations. Methods from signal processing are often applied in the analysis of dynamic measurements. In many applications linear time-invariant systems are appropriate to model dynamic measurements, where the output signal is obtained as a convolution of the input signal and the measurement system’s impulse response. Input and output signal are not proportional to each other, and estimation of the system’s input signal from its output signal constitutes one important task in the analysis of dynamic measurements. Often digital filters are employed for this purpose. The evaluation of the uncertainty associated with the estimated input signal is particularly important from a metrological perspective.

Typical dynamic measurement with time-dependent errors in the output signal caused by the dynamic behavior of the measurement system.

Typical examples are measurements of mechanical quantities as, for example, force, torque and pressure. Further examples are oscilloscope measurements for the characterization of high speed electronics, hydrophone measurements for the characterization of medical ultrasound devices, the spectral characterization of radiation sources, spectral color measurements and camera-aided temperature measurements.

 

Research

One focus of PTB‘s Working Group 8.42 is the development of methods for the estimation of the input signal from the output signal when the dynamic behavior of the measurement system has been characterized. This includes the development of procedures for the evaluation of the uncertainty associated with the estimated input signal. Another focus is the development of methods for the analysis of dynamic calibration measurements aimed at determining the dynamic behavior of a measurement system.

Software

Publications

S. Eichstädt and V. Wilkens
J. Acoust. Soc. Am., 141(6),
4155--4167,
2017.
M. Kobusch and S. Eichstädt
Acta IMEKO, 6(1),
3--12,
2017.
S. Eichstädt, C. Elster, I. M. Smith and T. J. Esward
J. Sens. Sens. Syst., 6
97-105,
2017.
S. Eichstädt, N. Makarava and C. Elster
Measurement Science and Technology, 27(12),
125009,
2016.
M. Dierl, T. Eckhard, B. Frei, M. Klammer, S. Eichstädt and C. Elster
Journal of the Optical Society of America A, 33(7),
1370--1376,
2016.
S. Eichstädt, V. Wilkens, A. Dienstfrey, P. Hale, B. Hughes and C. Jarvis
Metrologia, 53(4),
2016.
S. Eichstädt and V. Wilkens
Measurement Science and Technology, 27(5),
055001,
2016.
S. Eichstädt and C. Elster
tm - Technisches Messen, 83(2),
66-70,
2016.
M. Kobusch, S. Eichstädt, L. Klaus and T. Bruns
ACTA IMEKO, 4(2),
45-51,
2015.
(Open Access)
L. Klaus, B. Arendacká, M. Kobusch and T. Bruns
ACTA IMEKO, 3(1),
1-6,
2015.
(Open Access)
C. Matthews, F. Pennecchi, S. Eichstädt, A. Malengo, T. Esward, I. M. Smith, C. Elster, A. Knott, F. Arrhén and A. Lakka
Metrologia, 51(3),
326-338,
2014.
S. Eichstädt, B. Arendacká, A. Link and C. Elster
EPJ Web of Conferences, 77(3),
2014.
S. Eichstädt and C. Elster
Journal of Physics: Conference Series, 490(1),
012230,
2014.
B. Arendacká, A. Täubner, S. Eichstädt, T. Bruns and C. Elster
Measurement Science Review, 14(2),
52-61,
2014.
S. Eichstädt, F. Schmähling, G. Wübbeler, K. Anhalt, L. Bünger, U. Krüger and C. Elster
Metrologia, 50(2),
107-118,
2013.
S. Eichstädt, A. Link, P. M. Harris and C. Elster
Metrologia, 49(3),
401,
2012.
T. Bruns, A. Link and A. Täubner
Metrologia, 49(1),
27--31,
2012.
H. Füser, S. Eichstädt, K. Baaske, C. Elster, K. Kuhlmann, R. Judaschke, K. Pierz and M. Bieler
Measurement Science and Technology, 23(2),
025201,
2012.
S. Eichstädt and C. Elster
In F. Pavese, M. Bär, J.-R. Filtz, A. B. Forbes, L. Pendrill, K. Shirono, editor, Volume Advanced Mathematical & Computational Tools in Metrology and Testing IX  of Series on Advances in Mathematics for Applied Sciences
Chapter 16, page 126-135
Publisher: World Scientific New Jersey,
84 edition
2012.
T. J. Esward, C. Matthews, S. Downes, A. Knott, S. Eichstädt and C. Elster
In F. Pavese, M. Bär, J.-R. Filtz, A. B. Forbes, L. Pendrill, K. Shirono, editor, Volume Advanced Mathematical & Computational Tools in Metrology and Testing IX   of Series on Advances in Mathematics for Applied Sciences
Chapter 19, page 143-151
Publisher: World Scientific New Jersey,
84 edition
2012.
S. Eichstädt
PhD Thesis
2012.
S. Eichstädt, A. Link and C. Elster
Sensors, 10(8),
7621-31,
2010.
S. Eichstädt, A. Link, T. Bruns and C. Elster
Measurement, 43(5),
708-713,
2010.
S. Eichstädt, C. Elster, T. J. Esward and J. P. Hessling
Metrologia, 47(5),
522-533,
2010.
A. Link and C. Elster
Measurement Science and Technology, 20(5),
055104,
2009.
G. Wübbeler, A. Link, T. Bruns and C. Elster
In F. Pavese, M. Bär, J.M. Limares, C. Perruchet, N.F. Zhang, editor, Volume Advanced Mathematical & Computational Tools in Metrology VIII of Series on Advances in Mathematics for Applied Sciences
Chapter 52, page 369-374
Publisher: World Scientific New Jersey,
78 edition
2009.
C. Elster and A. Link
In F. Pavese, M. Bär, J.M. Limares, C. Perruchet, N.F. Zhang, editor, Volume Advanced Mathematical & Computational Tools in Metrology VIII of Series on Advances in Mathematics for Applied Sciences
Chapter 13, page 80-89
Publisher: World Scientific New Jersey,
78 edition
2009.
C. Elster and A. Link
Metrologia, 45(4),
464-473,
2008.
A. Link, A. Täubner, W. Wabinski, T. Bruns and C. Elster
Measurement, 40(9-10),
928-935,
2007.
C. Elster, A. Link and T. Bruns
Measurement Science and Technology, 18(12),
3682-3687,
2007.
H.-J. von Martens, C. Elster, A. Link, A. Täubner and T. Bruns
Metrologia, 43(1A),
09002-09002,
2006.
A. Link, A. Täubner, W. Wabinski, T. Bruns and C. Elster
Measurement Science and Technology, 17(7),
1888-1894,
2006.
A. Link, M. Kobusch, T. Bruns and C. Elster
tm - Technisches Messen, 73(12),
675-683,
2006.
H.-J. von Martens, W. Wabinski, A. Link, H.-J. Schlaak, A. Täubner and U. Göbel
Technisches Messen, 72
141-152,
2005.
A. Link, W. Wabinski and H.-J. von Martens
tm - Technisches Messen, 72(3-2005),
153-160,
2005.
A. Link and H.-J. Martens
Measurement, 35(1),
191-199,
2004.
A. Link, W. Wabinski and H.-J. Martens
Proceedings of SPIE Volume 5503
page 580-587
2004.
C. Elster
Measurement Science and Technology, 11(9),
1359,
2000.
H.-J. von Martens, A. Täubner, W. Wabinski, A. Link and H.-J. Schlaak
Measurement, 28(1),
3-20,
2000.
J. Gerhardt and H.-J. Schlaak
tm - Technisches Messen, 6(1),
274-282,
2000.
A. Link and H.-J. Martens
Shock. Vib., 7(1),
101-112,
2000.
A. Link, W. Wabinski, A. Pohl and H.-J. von Martens
Proceedings of SPIE
page 126-136
2000.
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