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Analysis of dynamic measurements

Working Group 8.42

Overview

Dynamic measurements can be found in many areas of metrology and industry such as, for instance, in the measurement of time-dependent forces or accelerations. Methods from signal processing are often applied in the analysis of dynamic measurements. In many applications linear time-invariant systems are appropriate to model dynamic measurements, where the output signal is obtained as a convolution of the input signal and the measurement system’s impulse response. Input and output signal are not proportional to each other, and estimation of the system’s input signal from its output signal constitutes one important task in the analysis of dynamic measurements. Often digital filters are employed for this purpose. The evaluation of the uncertainty associated with the estimated input signal is particularly important from a metrological perspective.

Typical dynamic measurement with time-dependent errors in the output signal caused by the dynamic behavior of the measurement system.

Typical examples are measurements of mechanical quantities as, for example, force, torque and pressure. Further examples are oscilloscope measurements for the characterization of high speed electronics, hydrophone measurements for the characterization of medical ultrasound devices, the spectral characterization of radiation sources, spectral color measurements and camera-aided temperature measurements.

 

Research

One focus of PTB‘s Working Group 8.42 is the development of methods for the estimation of the input signal from the output signal when the dynamic behavior of the measurement system has been characterized. This includes the development of procedures for the evaluation of the uncertainty associated with the estimated input signal. Another focus is the development of methods for the analysis of dynamic calibration measurements aimed at determining the dynamic behavior of a measurement system.

Software

Publications

Publication single view

Article

Title: Optoelectronic time-domain characterization of a 100 GHz sampling oscilloscope
Author(s): H. Füser, S. Eichstädt, K. Baaske, C. Elster, K. Kuhlmann, R. Judaschke, K. Pierz and M. Bieler
Journal: Measurement Science and Technology
Year: 2012
Volume: 23
Issue: 2
Pages: 025201
IOP Publishing
DOI: 10.1088/0957-0233/23/2/025201
ISSN: 0957-0233
File URL: fileadmin/internet/fachabteilungen/abteilung_8/8.4_mathematische_modellierung/Publikationen_8.4/Fueser_Osci_preprint.pdf
Web URL: http://iopscience.iop.org/article/10.1088/0957-0233/23/2/025201
Keywords: dynamic measurement, oscilloscope, dynamic calibration, impulse response
Tags: 8.42,Dynamik
Abstract: We have performed an optoelectronic measurement of the impulse response of an ultrafast sampling oscilloscope with a nominal bandwidth of 100 GHz within a time window of approximately 100 ps. Our experimental technique also considers frequency components above the cut-off frequency of higher-order modes of the 1.0 mm coaxial line, which is shown to be important for the specification of the impulse response of ultrafast sampling oscilloscopes. Additionally, we have measured the reflection coefficient of the sampling head induced by the mismatch of the sampling circuit and the coaxial connector which is larger than 0.5 for certain frequencies. The uncertainty analysis has been done using the Monte Carlo method of Supplement 1 to the ‘Guide to the Expression of Uncertainty in Measurement’ and correlations in the estimated impulse response have been determined. Our measurements extend previous work which deals with the characterization of 70 GHz oscilloscopes and the measurement of 100 GHz oscilloscopes up to the cut-off frequency of higher-order modes.

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