A dedicated low-energy storage ring for metrology with synchrotron radiation
The Physikalisch-Technische Bundesanstalt (PTB), Germany’s national metrology institute, is using synchrotron radiation for metrology and related applications for research and industry. In this context, PTB has extended its activities with an own storage ring, the Metrology Light Source (MLS), designed and built to meet dedicated demands for metrology. The MLS is located in the vicinity of the BESSY II storage ring facility in Berlin-Adlershof (Germany) and started user operation in spring 2008. The PTB departments 7.1 and 7.2 operate a laboratory at the MLS with currently 12 experimental stations. PTB offers precision measurements and calibrations in the spectral range from the far infrared / THz to the extreme ultraviolet (EUV), thus complementing its activities at BESSY II, which cover the short-wavelength spectral ranges from the E(UV) to the X-ray range. At both facilities, PTB offers metrological services to customers and cooperation partners, from routine calibrations to customized metrological solutions and metrology oriented research.
Beamline/ measuring set-up | Source | Mono- chromator | Spectral range (Wavelength) | Spectral resolving power | Photon flux (/ s-1) | Beam size [hor. · vert. (/ mm2)] | Diver-gence [hor. · vert. (/ mrad2)] | Paper (DOI-Link) | |
---|---|---|---|---|---|---|---|---|---|
1a | VUV irradiation | MLS U125 | Reflection filter | ≥ 40 nm | Broadband | 1013 | 3 · 3 | ≤ 1 · 1 | |
1b | Direct undulator radiation | MLS U125 | none | 65 nm to 1500 nm (1st harm.) | Broadband | ||||
1c | IDB | MLS U125 | NI-GI reflection grating cPGM | 4 nm to 400 nm | 103 | 1012 | ≤ 2 · 2 (variable) | ≤ 0.7 · 1.0 | 1c |
1d | IR undulator radiation | MLS U125 | none | 500 nm to 1500 nm (1st harm.) | Broadband | ||||
1e | 90° undulator radiation | MLS U125 | none | 500 nm to 1500 nm (1st harm.) | Broadband | ||||
2a | White-light beamline | MLS Dipole | |||||||
2b | Source calibration | MLS Dipole | Seya/Toroidal grating | 7 nm to 400 nm | |||||
3 | EUVR | MLS Dipole | Plane grating | 5 nm to 50 nm | 103 | 1012 | ≤ 2 · 2 (variable) | ≤ 4 · 2 (variable) | 3 |
4 | NIM | MLS Dipole | Normal incidence | 40 nm to 400 nm | 102 | 1010 to 1012 | ≤ 3 · 2 | ≤ 13 · 10 | 4 |
5 | THz | MLS Dipole | FTIR | 100 μm to 7 mm | 101 to 103 | 1 · 1 (focus) | 80 · 80 (collimated) | 5 | |
6 | IR | MLS Dipole | FTIR | 600 nm to 1000 μm | 102 to 104 | up to 1017 | 1.0 · 0.7 (focus) | 50 · 30 (collimated) | 6 |
7 | ring current | MLS Dipole | diagnostics | Broadband |