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Metrology Light Source

A dedicated low-energy storage ring for metrology with synchrotron radiation

The Opens internal link in current windowPhysikalisch-Technische Bundesanstalt (PTB), Germany’s national metrology institute, is using synchrotron radiation for metrology and related applications for research and industry. In this context, PTB has extended its activities with an own storage ring, the Metrology Light Source (MLS), designed and built to meet dedicated demands for metrology. The MLS is located in the vicinity of the Opens external link in new windowBESSY II storage ring facility in Opens external link in new windowBerlin-Adlershof (Germany) and started user operation in spring 2008. The PTB departments Opens internal link in current window7.1 and Opens internal link in current window7.2 operate a laboratory at the MLS with currently eleven experimental stations. PTB offers precision measurements and calibrations in the spectral range from the far infrared / THz to the extreme ultraviolet (EUV), thus complementing its activities Opens internal link in current windowat BESSY II, which cover the short-wavelength spectral ranges from the E(UV) to the X-ray range. At both facilities, PTB offers metrological services to customers and cooperation partners, from routine calibrations to customized metrological solutions and metrology oriented research.

Beamline/
measuring set-up
SourceMono-
chromator
Spectral range
Spectral
resolving power
Photon flux
Beam size
(hor. · vert.)
Divergence
(hor. · vert.)
Wavelength/ s-1/ mm2/ mrad2
1a
VUV irradiationMLS U125Reflection filter≥ 40 nmBroadband10133 · 3≤ 1 · 1
1b
Direct undulator radiationMLS U125none65 nm to
1500 nm
(1st harm.)
Broadband
1c
IDBMLS U125NI-GI reflection
grating cPGM
4 nm to
400 nm
1031012≤ 2 · 2
(variable)
≤ 0.7 · 1.0
1d
IR undulator radiationMLS U125
none500 nm to
1500 nm
(1st harm.)
Broadband
1e
90° undulator radiation MLS U125none500 nm to
1500 nm
(1st harm.)
Broadband
2a
White-light beamlineMLS Dipole
2b
Source calibrationMLS Dipole
Seya/Toroidal grating7 nm to
400 nm
3EUVRMLS DipolePlane grating5 nm to
50 nm
1031012≤ 2 · 2
(variable)
≤ 4 · 2
(variable)
4NIMMLS DipoleNormal incidence40 nm to
400 nm
1021010 to 1012≤ 3 · 2≤ 13 · 10
5THzMLS DipoleFTIR100 μm to
7 mm
101 to 1031 · 1 (focus)80 · 80
(collimated)
6IRMLS DipoleFTIR600 nm to
1000 μm
102 to 104up to 10171.0 · 0.7
(focus)
50 · 30
(collimated)
7ring currentMLS DipolediagnosticsBroadband