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X-ray Spectrometry

Working Group 7.24


The X-ray spectrometry group provides services, research and development for x-ray spectroscopic measurement techniques using synchrotron radiation. The developed experimental methods as well as the highly specialized and calibrated instrumentation allows for reference-free quantitative experiments and supplements available commercial laboratory equipment.

The group operates three beam lines at the PTB laboratory at the BESSY II, covering a photon energy range from 78 eV to 60 keV (15.9 nm to 0.02 nm).

Research activities and expertise cover the fields of surface and interface characterization of nano- and micro-scaled samples from key technologies, e.g. nanoelectronics, biotechnology, energy conversion and storage or medicine exists.

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  • Qualitative and quantitative (reference-free) X-ray fluorescence analysis  (XRF, GIXRF, TXRF)
  • High- resolution energy- and wavelength-dispersive X-ray emission spectrometry (XES)
  • X-ray absorption fine structure spectroscopy (XAFS)
  • Development of UHV-Instrumentation for XRF applications
  • Experimental determination of atomic fundamental parameters

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  • Determination of surface contaminations on wafer materials
  • Determination of elemental mass depositions of thin layers

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