Profile
The X-ray spectrometry group provides services, research and development for x-ray spectroscopic measurement techniques using synchrotron radiation. The developed experimental methods as well as the highly specialized and calibrated instrumentation allows for reference-free quantitative experiments and supplements available commercial laboratory equipment.
The group operates three beam lines at the PTB laboratory at the BESSY II, covering a photon energy range from 78 eV to 60 keV (15.9 nm to 0.02 nm).
Research activities and expertise cover the fields of surface and interface characterization of nano- and micro-scaled samples from key technologies, e.g. nanoelectronics, biotechnology, energy conversion and storage or medicine exists.
Research/Development
- Qualitative and quantitative (reference-free) X-ray fluorescence analysis (XRF, GIXRF, TXRF)
- High- resolution energy- and wavelength-dispersive X-ray emission spectrometry (XES)
- X-ray absorption fine structure spectroscopy (XAFS)
- Development of UHV-Instrumentation for XRF applications
- Experimental determination of atomic fundamental parameters
Services
Information
X-ray spectometry with synchrotron radiation
Reference-free X-Ray Fluorescence analysis (XRF)- Grazing incidence X-Ray Fluorescence (GIXRF)
- Total reflection X-Ray Fluorescence (TXRF)
- High resolution wavelength-dispersive X-Ray Fluorescence Analysis (RFA)
- X-ray absorption fine structure spectroscopy (XAFS)
- Determination of atomic fundamental parameters