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X-ray Radiometry

Working Group 7.21

Profile

The working group X-ray Radiometry is responsible for radiometry in the X-ray range and for the application of X-rays in dimensional nanometrology. Some of the activities are X-ray detector calibration, characterization of X-ray optical components, thickness determination of nanolayers and size determination of nanoparticles. The working group operates 3 beamlines at BESSY II in the spectral range from 1.6 keV to 10 keV and uses 2 additional beamlines in adjacent spectral ranges.

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Research/Development

  • Development of instrumentation for the characterization of silicon pore optics for the envisaged X-ray space mission ATHENA in cooperation with ESA
  • Characterization of photoemissive detectors and multilayer mirrors for plasma diagnostics in cooperation with CEA (France)
  • Characterization of large area hybrid pixel X-ray detectors in cooperation with Dectris Ltd. (Switzerland)
  • Traceable concentration determination for nanoparticles with Small-Angle X-ray Scattering (SAXS) in the EMPIR project InNanoPart
  • Characterization of nanoobjects with SAXS e. g. in cooperation with the Helmholtz-Zentrum Berlin (HZB)
  • Characterization of nanostructured surfaces with GISAXS (Grazing Incidence SAXS)
  • Surface investigation on silicon spheres for the redefinition of the kilogramm

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Services

The following calibrations according to the Initiates file downloadquality management handbook of PTB division 7 are performed in the working group 7.11:

  • Determination of the spectral responsivity of radiation detectors in the photon energy range from 1.75 keV to 60 keV (7.1-1.6, 7.1-1.9)
  • Determination of the spectral reflectivity or spectral transmittance of mirrors and filters in the photon energy range from 1.75 keV to 10 keV (7.1-1.8)
  • Determination of the thickness of thin layers on reflecting surfaces in the range from 2 nm to 1000 nm (depending on material) with X-ray reflectometry (7.1-1.11)
  • Determination of the mean diameter of nanoparticles in suspension in the range from 3 nm to 300 nm with small angle X-ray scattering (SAXS) (7.1-1.12)

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Information

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