X-ray Metrology with Synchrotron Radiation

Department 7.2

Tasks

Application of synchrotron radiation especially in the X-ray range for basic and applied metrological tasks with main focus on radiometry, spectroscopy and nanometrology:

Operation and application of the Metrology Light Source (MLS) and BESSY II as primary source standards of calculable synchrotron radiation
Realisation of spectral responsivity scales in the X-ray range and calibration of X-ray detector
Calibration of radiation sources
Characterisation of space instrumentation
Reflectometry on optical components in X-ray ranges and layer thickness determination with X-ray reflectometry (XRR)
Size determination of nanoparticles with small-angle X-ray scattering (SAXS)
Investigation of nanostructured surfaces with X-ray scattering (GISAXS)
Development and application of reference-free X-ray fluorescence analysis for material characterisation

News

The optical constants fully describe how a material transmits, reflects, absorbs, refracts or scatters light. Their precise knowledge is therefore of central importance for optical technology. As part of the European joint projects "Advanced Traceable Metrology for Optical Constants" (ATMOC) and "14 Angstrom CMOS IC technology" (14ACMOS), PTB has started to build up a database of optical constants...

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Reconstructed electron distributions of the 2s and 2p states of neon

Reconstructing the spatial electron density of atomic systems not only provides new insights into quantum mechanics, but also advances in areas such as material science and functional surfaces. In the photoelectric effect, photoelectrons are emitted through interaction with light...

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