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X-ray Metrology with Synchrotron Radiation

Department 7.2


Application of synchrotron radiation especially in the X-ray range for basic and applied metrological tasks with main focus on radiometry, spectroscopy and nanometrology:


A nanospectroscopic device platform has been developed for the thermoelectric detection of molecular fingerprints of soft materials at nanometer scale spatial resolution. The technique makes use of a locally generated thermal gradient converted into a thermoelectric voltage that is read out in the underlying device. The thermal gradient is generated by an illuminated atomic force microscope tip...

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The metrological support of the German and European industries in the development of EUV lithography for semiconductor manufacturing is a major activity of PTB at its Berlin-Adlershof site. The close cooperation with ZEISS since 1998 forms a significant basis for the continuous development of PTB's metrological capabilities in the extreme ultraviolet spectral range (EUV). Based on the use of...

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Perovskite solar cells (CsPbI3-xBrx) with a low bandgap are an important ingredient in the development of highly efficient tandem solar cells, which layer a perovskite solar cell on top of a silicon solar cell to combine the light harvesting capabilities of both and reach high overall efficiency. The efficiency is vastly influenced by the crystal structure - phase composition and crystal...

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