Logo of the Physikalisch-Technische Bundesanstalt

X-ray Metrology with Synchrotron Radiation

Department 7.2


Application of synchrotron radiation especially in the X-ray range for basic and applied metrological tasks with main focus on radiometry, spectroscopy and nanometrology:


The optical constants fully describe how a material transmits, reflects, absorbs, refracts or scatters light. Their precise knowledge is therefore of central importance for optical technology. As part of the European joint projects "Advanced Traceable Metrology for Optical Constants" (ATMOC) and "14 Angstrom CMOS IC technology" (14ACMOS), PTB has started to build up a database of optical constants...

[ more ]

Reconstructing the spatial electron density of atomic systems not only provides new insights into quantum mechanics, but also advances in areas such as material science and functional surfaces. In the photoelectric effect, photoelectrons are emitted through interaction with light...

[ more ]
More news

Show Working GroupsHide Working Groups