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X-ray Metrology with Synchrotron Radiation

Department 7.2


Application of synchrotron radiation especially in the X-ray range for basic and applied metrological tasks with main focus on radiometry, spectroscopy and nanometrology:


In scanning probe microscopy (SPM) images of surfaces are created by moving a tip across the surface. Research in SPM aims to find suitable tips and physical interaction mechanisms which uncover specific surface properties. An important and proven method for mapping the magnetic order of ferromagnetic surfaces is magnetic force microscopy based on the magnetic dipole interaction ...

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Fourier transform infrared (FTIR) spectroscopy is a powerful technique in analytical chemistry. Typically, spatially distributed spectra of the substance of interest are registered simultaneously using FTIR spectrometers equipped with array detectors. Scanning methods such as near-field FTIR spectroscopy are a promising alternative providing higher...

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