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X-ray Metrology with Synchrotron Radiation

Department 7.2

Tasks

 

Application of synchrotron radiation especially in the X-ray range for basic and applied metrological tasks with main focus on radiometry, spectroscopy and nanometrology:

 

News

 

The metrological support of the German and European industries in the development of EUV lithography for semiconductor manufacturing is a major activity of PTB at its Berlin-Adlershof site. The close cooperation with ZEISS since 1998 forms a significant basis for the continuous development of PTB's metrological capabilities in the extreme ultraviolet spectral range (EUV). Based on the use of...

 

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Perovskite solar cells (CsPbI3-xBrx) with a low bandgap are an important ingredient in the development of highly efficient tandem solar cells, which layer a perovskite solar cell on top of a silicon solar cell to combine the light harvesting capabilities of both and reach high overall efficiency. The efficiency is vastly influenced by the crystal structure - phase composition and crystal...

 

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A new algorithm allows the fast reconstruction of atom distributions in 3D nanostructured surfaces

Over the last years, PTB has developed a new method for atom-specific reconstruction of periodically nanostructured surfaces. Recent studies have shown experimentally that it is possible to reconstruct and identify the spatial distribution of different atomic species in nano-components using X-ray...

 

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