
Tasks
- Operation and application of the Metrology Light Source (MLS) and BESSY II as primary source standards of calculable synchrotron radiation
- Realisation of spectral responsivity scales in the X-ray range and calibration of X-ray detector
- Calibration of radiation sources
- Characterisation of space instrumentation
- Reflectometry on optical components in X-ray ranges and layer thickness determination with X-ray reflectometry (XRR)
- Size determination of nanoparticles with small-angle X-ray scattering (SAXS)
- Investigation of nanostructured surfaces with X-ray scattering (GISAXS)
- Development and application of reference-free X-ray fluorescence analysis for material characterisation