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News Archive 2015

Departments 7.1 and 7.2

 

The 290th PTB Seminar "VUV and EUV Metrology" took place in the Hermann von Helmholtz Building on 5 and 6 November 2015. This year's seminar, which was the third in a series on this topic which started back in 2011, also provided a platform ...

 

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Matthias Müller, a research assistant with Working Group 7.24 "X-ray and IR Spectrometry", and Claudia Zech, a doctoral candidate in the same working group, were awarded the Helmut Fischer Foundation's Poster Prize for their poster "X-ray absorption fine structure of sulfur in a Li-S battery cathode measured under protective atmosphere" at the PRORA 2015 ...

 

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The three-dimensional distribution of electrons inside molecules has been made visible for the first time at PTB's electron storage ring Metrology Light Source (MLS) in Berlin-Adlershof by means of electron spectroscopy. For this purpose, molecules which were aligned on a metallic surface were irradiated with shortwave ...

 

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Christian Gollwitzer, PostDoc in the Working Group 7.11 'X-ray radiometry', and Raul Garcia-Diez, PhD student in the same WG, have received the best poster award at the "29th Conference of the European Colloid and Interface Society" (ECIS 2015) in Bordeaux and the prize ...

 

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By means of improved measurement procedures, PTB employees from the field of spectrometry with synchrotron radiation have succeeded – in cooperation with partners from industry – in experimentally confirming the different energy dependencies of partial photoionization cross sections which could so far be predicted only by theoretical calculations. Due to this, the quantification approach of an...

 

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The kick-off meeting for the project "Seven Nanometre Technology" (SeNaTe) has recently taken place on the occasion of IMEC in Leuven and within the scope of the EU programme "Horizon 2020" in the ECSEL call 2014-2 "Innovation Actions". PTB is one among 41 partners taking part in the 3-year project for the development of the technological infrastructure for the manufacturing of semiconducting ...

 

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