Tasks
- Realisation of spectral responsivity scales in the UV, VUV, EUV, and soft X-ray ranges by means of cryogenic radiometers as primary detector standards
- Calibration of radiation sources and detectors from the UV to soft X-rays
- Photon diagnostics and materials research at X-ray lasers
- Characterisation of space instrumentation
- Reflectometry on optical components and materials from the UV to X-rays, in particular for EUV lithography
- Investigation of nanolayers and nanostructure applying scattering techniques, soft X-ray reflectometry and IR-nearfield microscopy
- Quantitative characterization of surfaces and thin layers applying VUV ellipsometry, electron spectroscopy and IR-spectrometry
