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Production sequence of Si-spheres and interferometrical determination of the sphere volume

Multiwavelength Interferometry for Geodetic Lengths

Working Group 5.42

2017

  • Meiners-Hagen, K.; Meyer, T.; Mildner, J.; Pollinger, F.:
    SI-traceable absolute distance measurement over more than 800 meters with sub-nanometer interferometry by two-color inline refractivity compensation
    Opens external link in new windowApplied Physics Letters 111, 191194
  • JRP SIB60 Surveying Final Publishable JRP Report
    Opens external link in new windowEURAMET
  • Astrua, M.; Bauch, A.; Eusébio, L.; Fordell, T.; Homann, C.; Jokela, J.; Kallio, U.; Koivula, H.; Kuhlmann, H.; Lahtinen, S.; Marques, F.; Niemeier, W.; Pellegrino, O.; Pires, C.; Pollinger, F.; Poutanen, M.; Saraiva, F.; Schön, S.; Tengen, D.; Wallerand, J.-P.; Zimmermann, F.; Zucco, M.:
    Metrology for long distance surveying with GNSS and EDM = Metrologie für die Entfernungsmessung mit GNSS und EDM;; Metrology for long distance surveying with GNSS and EDM
    Opens external link in new windowDVW Merkblatt 09-2017

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2016

  • Pollinger, F.; Bauch, A.; Leute, J.; Meiners-Hagen, K.; Mildner, J.; Guillory, J.; Wallerand, J.-P.; Jokela, J.; Kallio, U.; Koivula, H.; Lahtinen, S.; Poutanen, M.; Astrua, M.; Francese, C.; Zucco, M.; Eusebio, L.; Marques, F.; Pires, C.; Saraiva, F.; Pellegrino, O.; Tomberg, T.; Hieta, T.; Fordell, T.; Merimaa, M.; Kupko, V.; Neyezhmakov, P.; Bergstrand, S.; van den Berg, S. A.; Kersten, T.; Krawinkel, T.; Schön, S.; Homann, C.; Tengen, D.; Niemeier, W.; Görres, B.; Zimmermann, F.; Kuhlmann, H.; Bhattacharya, N.; Lesundak, A.; Bosnjakovic, A.:
    JRP SIB60 Metrology for Long Distance Surveying- a concise survey on major project results
    Opens external link in new windowProceedings of the 3rd Joint International Symposium on Deformation Monitoring, Vienna, Austria, 30 March – 1 April 2016
  • Meiners-Hagen, K.; Meyer,T.; Prellinger, P.; Pöschel, P.; Dontsov, D.; Pollinger, F.:
    Overcoming the refractivity limit in manufacturing environment
    Opens external link in new windowOptics Express, Volume 24, Issue 21

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2015

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2014

  • Yang, R.; Pollinger, F.; Meiners-Hagen, K.; Tan, J.; Bosse, H.:
    Heterodyne multi-wavelength absolute interferometry based on a cavity-enhanced electro-optic frequency comb pair
    Opens external link in new windowOptics Letters 39, 5834 (2014)

  • Meiners-Hagen, K.; Pollinger, F.; Prellinger, G.; Rost, K.; Wendt, K.; Pöschl, W.; Dontsov, D.; Schott, W.; Mandryka, V.:
    Refractivity compensated tracking interferometer for precision engineering
    Proceedings of the 58th IWK, Opens external link in new windowIlmenau Scientific Colloquium, urn:nbn:de:gbv:ilm1-2014iwk-119:6, 11 Seiten (2014)

  • Wisniewski, M.; Ramotowski, Z.; Pollinger, F.; Wedde, M.; Matus, M.; Banhidi-Bergendorf, Z.; Stalder, O.; Thalmann, R.; Lassila, A.; Unkuri, J.; Balling, P.; Hynek, J.; Astrua, M.; Pisani, M.; Prieto, E.; Karlsson, H.; Hansrud Kjær, P.; Flys, O.; Lillepea, L.; Odrats, I.; Fíra, R.; Fodrekova, A.; Harnosova, E.; Duta,  A.; Teoderescu, D.:
    Final report on supplementary comparison EURAMET.L-S20: Comparison of laser distance measuring instruments
    Opens external link in new windowMetrologia 51 04002 (2014)

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2013

  • Prellinger, G.; Meiners-Hagen, K.; Pollinger, F.:
    Spectroscopic traceability route for variable synthetic wavelength absolute distance interferometry
    Fringe 2013: 7th international Workshop on Advanced Optical Imaging and Metrology, W. Osten (Ed.), Opens external link in new windowSpringer-Verlag Berlin Heidelberg, 843 (2014)

  • Pollinger, F.; Astrua, M.; Bauch, A.; Bergstrand, S.; Görres, B.; Jokela, J.; Kallio, U.; Koivula, H.; Kuhlmann, H.; Kupko, V.; Meiners-Hagen, K.; Merimaa, M.; Niemeier, W.; Neyezhmakov, P.; Poutanen, M.; Saraiva, F.; Schön, S.; van den Berg, S. A.; Wallerand, J. P.:
    Metrology for long distance surveying - a joint attempt to improve traceability of long distance measurements 
    erscheint in P. Willis (Ed.),  Proceedings of the IAG Scientific Assembly, Potsdam, September 1-6, 2013, International Association of Geodesy Symposia, Springer-Verlag Berlin Heidelberg, in Vorbereitung

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2012

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2011

  • Pollinger, F.; Doloca, N. R.; Meiners-Hagen, K.; Wedde, M.; Abou-Zeid, A.:
    Measurements of absolute long distances.
    ISPEMI 2010, 6th International Symposium on Precision Engineering Measurements and Instrumentation, Hangzhou, 08-11, August, 2010, China; Proceedings of SPIE: 7544 (2010), 754445-1 - 75445-10; Identifier: dx.doi.org/10.1117/12.885596;
    ISBN 978-0-8194-7940-2; Verlag Bellingham, Wash.: SPIE (2011)

  • Meiners-Hagen, K. [speaker]; Abou-Zeid, A.:
    A four wavelength interferometer with compensation of refractive index.
    Project EMRP JRP 3.1, Long Distance Measurement in Air, 3rd Workshop: (2011); Identifier: www.longdistanceproject.eu/workshops; 3rd workshop on long distance measurement in air, Prag, 27, May, 2011, Czech

  • Meiners-Hagen, K.; Köchert, P.; Abou-Zeid, A.:
    A multiwavelength interferometer for geodetic lengths.
    ISBN 978-3-18-092156-3; 10th IMEKO Symposium Laser Metrology for Precision Measurement and Inspection in Industry (LMPMI) 2011 : (VDI-Berichte: 2156): 297 - 302 (2011).

  • Pollinger, F.; Meiners-Hagen, K.; Doloca, N. R.; Abou-Zeid, A.:
    Spectroscopic determination of the effective humidity for distance measurements in air.
    56th International Scientific Colloquium: Conference proceedings; Identifier: nbn-resolving.de/urn:nbn:de:gbv:ilm1-2011iwk-094:3; 56th International Scientific Colloquium (IWK): Innovation in Mechanical Engineering - Shaping the Future, Ilmenau (2011).

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2010

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2009

  • Pollinger, F.; Meiners-Hagen, K.; Wedde, M.; Abou-Zeid, A.:
    Diode-laser-based high-precision absolute distance interferometer of 20 m range.
    Applied Optics: 48 (2009), 32, 6188 - 6194; Identifier: dx.doi.org/10.1364/AO.48.006188;
    ISSN 0003-6935; Verlag Washington, DC: OSA(2009)

  • Meiners-Hagen, K.; Schödel, R.; Pollinger, F.; Wedde, M.; Abou-Zeid, A.:
    Multi-wavelength interferometry for length measurements using diode lasers.
    Measurement Science Review: 9 (2009), 1, 16-25; Identifier: dx.doi.org/10.2478/v10048-009-0001-y;
    ISSN 1335-8871; Verlag Warsaw: Versita (2009)

  • Höink, A.; Meiners-Hagen, K.; Jusko, O.; Abou-Zeid, A.:
    Form measurement of thin cylinders using three-wavelength interferometry.
    ISOT 2009 International Symposium on Optomechatronic Technologies, Istanbul,
    21-23, September, 2009, Turkey; [CD-ROM] file name: papers\254.pdf, 110 - 115; ISBN 978-1-4244-4210-2;
    Verlag [Piscataway, NJ]: IEEE (2009)

  • Höink, A.; Meiners-Hagen, K.; Jusko, O.; Abou-Zeid, A.:
    Application of diode lasers in interferometrical length measurements.
    ISMTII 2009, 9th International Symposium on Measurement Technology and Intelligent Instruments, Saint-Petersburg, 29, June - 02, July, 2009, Russia; [CD-ROM] file name: Volume 4\7_02.pdf, 4-006 - 4-010; Verlag Saint-Petersburg: D.S. Rozhdestvensky Optical Society (2009)

  • Höink, A.; Meiners-Hagen, K.; Jusko, O.; Abou-Zeid, A.:
    Form measurement of small cylindrical objects using two-wavelength interferometry.
    ISIST 2008, 5th International Symposium on Instrumentation Science and Technology, Shenyang (Mukden),
    15-18, September, 2008, China; Proceedings of SPIE: 7133,2: (2009), 71333Q-1 - 71333Q-7;
    Identifier: dx.doi.org/10.1117/12.823464; ISBN 978-0-8194-7367-7; Verlag Bellingham, Wash.: SPIE (2009)

  • Meiners-Hagen, K.; Abou-Zeid, A.; Hartmann, L.:
    Absolute distance interferometry using diode lasers [poster]
    ISIST 2008, 5th International Symposium on Instrumentation Science and Technology, Shenyang (Mukden),
    15-18, September, 2008, China; Proceedings of SPIE: 7133,2: (2009), 713339-1 - 713339-7;
    Identifier: dx.doi.org/10.1117/12.808821; ISBN 978-0-8194-7367-7; Verlag Bellingham, Wash.: SPIE (2009)

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2008

  • Meiners-Hagen, K.; Abou-Zeid, A.:
    Air refractive index compensating interferometry for length measurements.
    Congresso International de Metrologia Mecanica: Anais: (2008), [CD-ROM] file name: ID77.doc;
    ISBN 978-85-86920-05-9; Verlag Rio de Janeiro: Sociedade Brasileira de Metrologia;
    I-CIMMEC, 1st International Congress on Mechanical Metrology, Brazil, Rio de Janeiro, 08-10, October, 2008

  • Meiners-Hagen, K.; Abou-Zeid, A.:
    Refractive index determination in length measurement by two-colour interferometry.
    International Symposium on Measurement Technology and Intelligent Instruments (ISMTII 2007) ; in: Measurement Science and Technology: 19 (2008), 8, 084004-1 - 084004-5;
    Identifier: dx.doi.org/10.1088/0957-0233/19/8/084004 ; ISSN 0957-0233; Herausgeber Gao, Wei; Tohoku University, Department of Nanomechanics, Sendai, JAPAN; Krystek, Michael; 5, Fertigungsmesstechnik, PTB-Braunschweig; Verlag Bristol: IOP
    ISMTII 2007, 8th International Symposium on Measurement Technology and Intelligent Instruments, Sendai, 24-27, September, 2007

  • Hartmann, L.; Meiners-Hagen, K.; Abou-Zeid, A.:
    Absolute distance interferometer with two external cavity diode lasers
    Measurement Science and Technology:19 (2008), 4, 045307-1 - 045307-6;
    Identifier: stacks.iop.org/0957-0233/19/045307 dx.doi.org/10.1088/0957-0233/19/4/045307 ISSN 0957-0233; Verlag Bristol: IOP; (2008)

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2007

  • Meiners-Hagen, K.; Abou-Zeid, A.:
    Air refractive index compensation in length measurements by optical interferometry
    Proceedings of ISMTII 2007: the 8th International Symposium on Measurement Technology and Intelligent Instruments: (2007), 51 - 54; Herausgeber: The International Committee on Measurements and Instrumentation JSPE Technical Committee for Intelligent Nano-Measure; Verlag Sendai: Tohoku University 8th International Symposium on Measurement Technology and Intelligent Instruments, Sendai, 24-27, September, 2007

  • Hartmann, L.; Meiners-Hagen, G.; Abou-Zeid, A.:
    Absolute distance interferometry using two diode lasers
    Proceedings of the 7th international conference, European Society for Precision Engineering and Nanotechnology: May 20th - May 24th 2007, Bremen, Germany. Vol. 2: (2007), 73 - 76; ISBN 0-9553082-2-4 ; ISBN 978-0-9553082-2-2; Herausgeber Thornett, E.; Verlag Bedford: Euspen 7th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 20-24, May, 2007

  • Meiners-Hagen, K.; Abou-Zeid, A.:
    Compensation of refractive index of air
    Proceedings of the 7th international conference, European Society for Precision Engineering and Nanotechnology: May 20th - May 24th 2007, Bremen, Germany. Vol. 2:(2007), 97 - 100; ISBN 0-9553082-2-4 ; ISBN 978-0-9553082-2-2; Herausgeber Thornett, E.; Verlag Bedford: Euspen 7th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 20-24, May, 2007

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2006

  • Hartmann, L.; Burgarth, V.; Meiners-Hagen, K.; Abou-Zeid, A.:
    Distance measurement by absolute interferometry using tunable diode lasers
    MAPAN:22 (2007), 1, 21 - 26; Identifier www.metrologyindia.org/mapan/22a/3-Lutz%20Hartmann.pdf ; ISSN 0970-3950; Verlag New Delhi: Metrology Society of India; 6th International Conference on Advances in Metrology, New Delhi, 11-13, December, 2006

  • Hartmann, L.; Burgarth, V.; Meiners-Hagen, K.; Abou-Zeid, A.:
    Distance measurement by absolute interferometry using tunable diode lasers
    International Conference on Advances in Metrology : AdMET 2006, December 11 - 13, 2006; [proceedings] (2006) 253 - 256 [print ed.]; [CD-ROM] file name: 053.pdf;
    ISBN 978-3-8007-2939-5 ; ISBN 3-8007-2939-3; Herausgeber Reindl, Leonhard M.; Verlag Berlin [u.a.]: VDE-Verlag; 6th International Conference on Advances in Metrology, New Delhi, 11-13, December, 2006

  • Hartmann, L.; Meiners-Hagen, K.; Abou-Zeid, A.:
    Distance measurement by absolute interferometry using two diode lasers
    Reindl, Leonhard M., Verlag Berlin [u.a.]: VDE-Verlag, ISBN 978-3-8007-2939-5; ISBN 3-8007-2939-3: Sensoren und Messsysteme 2006, Vorträge der 13. ITG/GMA-Fachtagung vom 13. bis 14.3.2006 in Freiburg/Breisgau: p. 253 - 256 [print ed.]; [CD-ROM] file name: 053.pdf (2006)

  • Meiners-Hagen, K.; Terra, O.; Abou-Zeid, A.:
    Two colour interferometry
    Reindl, Leonhard M., Verlag Berlin [u.a.]: VDE-Verlag, ISBN 978-3-8007-2939-5 ; ISBN 3-8007-2939-3, Sensoren und Messsysteme 2006: Vorträge der 13. ITG/GMA-Fachtagung vom 13. bis 14.3.2006 in Freiburg/Breisgau: p. 249 - 252 [print ed.]; [CD-ROM] file name: 052.pdf (2006)

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