Publikationen / Publications
2011
2012
- Mai, T.; Bartl, G.; Nicolaus, A.:
"Uncertainty considerations on the new Avogadro sphere inerferometer." CPEM, Washington, DC, 01-06, July, 2012, USA - Nicolaus, A.; Bartl, G.; Bettin, H.; Busch, I.; Borys, M.; Krüger-Sehm, R.; Krumrey, M.; Kuetgens, U.:
"State of the Avogadro 28Si spheres." CPEM, Washington, DC, 01-06, July, 2012, USA - Bartl, G.; Schödel, R.:
"Scanning phase shift interferometry in length measurement." MacroScale 2011 - Recent developments in traceable dimensional measurements, Bern-Wabern, 04-06, October, 2011, Switzerland - Bartl, G.; Krystek, M.; Nicolaus, A.:
"Messung von absoluten Kugelradiustopografien mit einem Kugelinerferometer - Interpolationsmethoden = Determination of topographies of absolute sphere radii with a sphere interferometer - interpolation methods." XXV. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V., Karlsruhe, 22-24, September, 2011
2012 Conference on Precision Electromagnetic Measurements digest: (2012), (CD-ROM) file name: 238.pdr, 474 - 475;
Identifier:
dx.doi.org/10.1109/CPEM.2012.6251009ISBN 978-1-4673-0441-2 ; ISBN 978-1-4673-0439-9; IEEE Operations Center, Piscataway, NJ
2012 Conference on Precision Electromagnetic Measurements digest: (2012), (CD-ROM) file name: 237.pdr, 472 - 473;
Identifier:
dx.doi.org/10.1109/CPEM.2012.6251008ISBN 978-1-4673-0441-2 ; ISBN 978-1-4673-0439-9; IEEE Operations Center, Piscataway, NJ
MacroScale 2011 proceedings: recent developments in traceable dimensional measurements (online only), 6 S.
Identifier:
www.macroscale.org/macroscale/macroscale-proceedings-list.htmlXXV. Messtechnisches Symposium 2011 in: Technisches Messen: 79 (2012), 4, 196 - 201;
Identifier:
dx.doi.org/10.1524/teme.2012.0222; ISSN 0171-8096; Verlag Oldenbourg, München
2011
- Kuramoto, N.; Fujii, K.; Gray, M.; Manson, P.; Bartl, G.; Nicolaus, Giardini, W.:
"Diameter comparision of silicon sphere for the International Avogadro Project."
2010 Conference on Precision Electromagnetic Measurements, Daejon, 13-18, June, 2010, South Korea;
IEEE Transaction on Instrumentation and Measurement: 60 (2011), 7, 2615 - 2620;
Identifier:dx.doi.org/10.1109/TIM.2010.2099272 ; ISSN 0018-9456; Verlag IEEE, New York - Andreas, B.; Azumo, Y.; Bartl, G.; Becker, P.; Bettin, H.; Borys, M.; Busch, I.; Fuchs, P.; Fujii, K.; Fujimoto, H.; Kessler, E.; Krumrey, N.; Kuetgens, U.; Kuramoto, N.; Mana, G.; Manson, P.; Massa, E.; Mizushima, S.; Nicolaus, A.; Picard, P.; Pramann, A.; Rienitz, O.; Schiel, D.; Valkiers, S.; Waseda, A.:
"Determination of the Avogadro constant by counting the atoms in a 28Si crystal."
Physical Review Letters: 106 (2011), 3, 030801-1 - 030801-4;
Identifier:dx.doi.org/10.1103/PhysRevLett.106.030801 ; link.aps.org/doi/10.1103/PhysRevLett.106.030801 ;
ISSN 0031-9007 (print) ; ISSN 1079-7114 (online) ; Verlag American Physical Society, Ridge, NY - Andreas, B.; Azumo, Y.; Bartl, G.; Becker, P.; Bettin, H.; Borys, M.; Busch, I.; Gray, M.; Fuchs, P.; Fujii, K.; Fujimoto, H.; Kessler, E.; Krumrey, N.; Kuetgens, U.; Kuramoto, N.; Mana, G.; Massa, E.; Mizushima, S.; Nicolaus, A.; Picard, P.; Pramann, A.; Rienitz, O.; Schiel, D.; Valkiers, S.; Waseda, A.; Zakel, S.:
"Counting the atoms on a 28Si crystal for a new kilogram defination."
Metrologia: 48 (2011), S1 - S13;
Identifier:dx.doi.org/10.1088/0026-1394/48/2/S01 ; stacks.iop.org/Met/48/S1 ;
ISSN 0026-1394 (print) ; ISSN 1681-7575 (online) ; Verlag IOP, Bristol - Bartl, G.; Bettin, H.; Krystek, M.; Mai, T.; Nicolaus, A.; Peter, A.:
"Volume determination of the Avogadro spheres of highly enriched 28Si with a sphereical Fizeau interferometer."
Metrologia: 48 (2011), S96 - S103;
Identifier:dx.doi.org/10.1088/0026-1394/48/2/S12 ; stacks.iop.org/Met/48/S96 ;
ISSN 0026-1394 (print) ; ISSN 1681-7575 (online) ; Verlag IOP, Bristol - Bettin, H.; Borys, M.; Busch, I.; Nicolaus, A.; Becker, P.:
"Avogadro constant determination for a redefined kilogram."
56th International Scientific Colloquium (IWK): Innovation in Mechanical Engineering - Shaping the Future, Ilmenau, 12-16, September, 2011;
Conference proceedings: (2011), (USB-Stick) file name: paper_id_1193.pdf, 7 S.; Univ.-Verlag Ilmenau - Bartl, G.; Krystek, M.; Nicolaus, A.:
"Messung von absoluten Kugelradiustopografien mit einem Kugelinerferometer = Determination of topographies of absolute sphere radii with a sphere interferometer." XXIV. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V., Hamburg, 23-25, September, 2010
XXIV. Messtechnisches Symposium 2010 in: Technisches Messen: 78 (2011), 4, 178 -183;
Identifier:
dx.doi.org/10.1524/teme.2011.0101 ; ISSN 0171-8096; Verlag Oldenbourg, München
2010
- Bartl, G.; Krystek, M.; Nicolaus, A.; Giardini, W.:
"Interferometric determination of the topographies of absolute sphere radii using the sphere interferometer of PTB." Measurement Science Technolgy: 21 (2010), 11, 115101-1 - 115101-8 - Bartl, G.:
"Interferometrische Bestimmung von absoluten Kugelradiustopografien."
Braunschweig, Techn. Univ., Dissertation: (2010), II, 130 S.; Identifier:www.digibib.tu-bs.de/?docid=00032342 - Kuramoto, N.; Fujii, K.; Gray, M.; Manson, P.; Bartl, G.; Nicolaus, A.; Giardini, W.:
"Diameter comparision of silicon sphere for the International Avogadro Project."
2010 Conference on Precision Electromagnetic Measurements, Daejon, 13-18, June, 2010, South Korea;
2010 Conference on Precision Electromagnetic Measurements digest: (2010), 127 - 128; ISBN 978-1-4244-6794-5 (print); ISBN 978-1-4244-6796-9 (CD-ROM); IEEE Operations Center, Piscataway, NJ - Becker, P.; Bettin, H.; Borys, M.; Busch, I.; Fujii, K.; Gray, M.; Krumrey, N.; Kuetgens, U.; Mana, G.;
Manson, P.; Massa, E.; Nicolaus, A.; Picard, P.; Schiel, D.; Valkiers, S.:
"Status of the NA determination by counting atoms in silicon crystal."
2010 Conference on Precision Electromagnetic Measurements, Daejon, 13-18, June, 2010, South Korea;
2010 Conference on Precision Electromagnetic Measurements digest: (2010), 107 - 108;
ISBN 978-1-4244-6794-5 (print) ; ISBN 978-1-4244-6796-9 (CD-ROM); IEEE Operations Center, Piscataway, NJ - Nicolaus, A.; Bartl, G.; Peter, A:
"Interferometrie an Kugeln." PTB-Mitteilungen: 120 (2010), 1, 23 - 30
Identifier:
dx.doi.org/10.1088/0957-0233/21/11/115101 ; stacks.iop.org/0957-0233/21/i=11/a=115101 ;ISSN 0957-0233 ; Verlag IOP, Bristol
Identifier:
http://www.ptb.de/cms/fileadmin/internet/publikationen/mitteilungen/2010/PTB-Mitteilungen_2010_Heft_1.pdf#page=24ISSN 0030-834X ; Wirtschaftsverlag NW, Bremerhaven
2009
- Nicolaus, A.; Bönsch, G.:
"Aperture correction for a sphere interferometer."
Metrologia: 46 (2009), 6, 668 - 673; Identifier:dx.doi.org/10.1088/0026-1394/46/6/009;
ISSN 0026-1394 (print) ; ISSN 1681-7575; Verlag IOP, Bristol - Bartl, G.; Nicolaus, A.:
"Extending the capabilities of the sphere interferometer of PTB by a stitching procedure."
Fringe 2009, Nürtingen, 14-16, September 2009, Deutschland;
Fringe 2009: the 6th International Workshop on Advances Optical Metrology: (2009), 354 - 357;
Identifier:dx.doi.org/10.1007/978-3-642-03051-2_58 ; ISSN 978-3-642-03050-5 ; Springer Verlag, Berlin - Bartl, G.; Nicolaus, A.; Kessler, E.; Schödel, R.; Becker, P.:
"The coeffizient of thermal expansion of highly enriched 28 Si."
Metrologia: 46 (2009), 5, 416 - 422; Identifier:dx.doi.org/10.1088/0026-1394/46/5/005 ; stacks.iop.org/0026-1394/46/416 ;
ISSN 0026-1394 (print) ; ISSN 1681-7575 (online) ; Verlag IOP, Bristol - Becker, P.; Nicolaus, A.:
"The marathon race to a new atomic kilogram."
Europhysics News: 40 (2009), 1, 23 - 26 ; Identifier:dx.doi.org/10.1051/epn/2009302 ;
ISSN 0531-7479 ; ISSN 1432-1092 ; Verlag EDP Schiences, Les Ulis - Bartl, G.; Nicolaus, A.:
"Influence of the distribution of measuring points on the mean diameter determination of the Avogadro project´s silicon sphere."
Measurements Science and Technology: 20 (2009), 6, 065104-1 - 065104-6 ;
Identifier:dx.doi.org/10.1088/0957-0233/20/6/065104 ; stacks.iop.org/MST/20/065104 ;
ISSN 0957-0233 ; Verlag IOP, Bristol - Bartl, G.; Nicolaus, A.:
"Investigations on diameter measurements of the Avogadro silicon sphere dependent on the position in the field of view of the interferometer optics." IEEE Transactions on Instrumentation and Measurement: 58 (2009), 4, 919 - 923;
Identifier:
dx.doi.org/10.1109/TIM.2008.2007057 ; ISSN 0018-9456; Verlag IEEE, New York
2008
- Bettin, H.; Borys, M.; Nicolaus, A.:
"Density: From the Measuring of a silicon Sphere to Archimedes´Principle =
Die Dichte: von der Vermessung einer Siliziumkugel zum Archimedischen Prinzip." Mass and devired quantities ; in PTB-Mitteilungen, engl.: 118 (2008), 2/3, spec. issue, 16 - 22;
Identifier:
http://www.ptb.de/cms/fileadmin/internet/publikationen/mitteilungen/2008/Mass_and_Derived_Quantities.pdf#page=17 ; PTB-Mitteilungen, deutsch: 118 (2008), 2, 77 - 83;
Identifier:
http://www.ptb.de/cms/fileadmin/internet/publikationen/mitteilungen/2008/PTB-Mitteilungen_2008_Heft_2.pdf#page=18 ;ISSN 0030-834x, Wirtschaftsverlag NW, Bremerhaven
- Bettin, H.; Nicolaus, A.; Rudtsch, S.; Massa, E.; Merlone, A.:
"Novel transfer standard for temperature."
2008 Conference on Precision Electromagnetic Measurements (CPEM 2008), Broomfield, Colorado, 8-13, June, 2008, USA;
2008 Conference on Precision Electromagnetic Measurements digest: (2008), 134 - 135; ISBN 978-1-4244-2399-6 (print) ; ISBN 978-1-4244-2400-9 (CD-ROM); IEEE Operations Center, Piscataway, NJ - Fujii, K. [speaker]; Waseda, A.; Kuramoto, N.; Becker, P.; Nicolaus, A.; Krumrey, N.; Danzebrink, H.-U.; Busch, I.; Bettin, H.; Mana, G.;
Massa, E.; Valkiers, S.; Giardini, W.; Kessler, E.; Downes, S.; Picard, P.; Riemann, H.:
"Status of the international effort on the x-ray crystal density work and its progress towards a measurement of the Avogadro constant."
2008 Conference on Precision Electromagnetic Measurements (CPEM 2008), Broomfield, Colorado, 8-13, June, 2008, USA;
2008 Conference on Precision Electromagnetic Measurements digest: (2008), 300 - 301;
ISBN 978-1-4244-2399-6 (print) ; ISBN 978-1-4244-2400-9 (CD-ROM); IEEE Operations Center, Piscataway, NJ - Nicolaus, A.; Bartl, G.:
"Influence of the optical quality of the interferometer optics on the diameter measurement of the Avogadro silicon sphere."
2008 Conference on Precision Electromagnetic Measurements (CPEM 2008), Broomfield, Colorado, 8-13, June, 2008, USA;
2008 Conference on Precision Electromagnetic Measurements digest: (2008), 412 - 413; ISBN 978-1-4244-2399-6 (print) ; ISBN 978-1-4244-2400-9 (CD-ROM); IEEE Operations Center, Piscataway, NJ - Becker, P.; Nicolaus, A.:
"Hat das Urkilogramm bald ausgedient?" Physik in unserer Zeit: 39 (2008), 4, 164 - 165;
Identifier:
dx.doi.org/10.1002/piuz.200890039 ; ISSN 0031-9252 ; Verlag Wiley-VCH, Weinheim- Bartl, G.; Nicolaus, A.:
"Einfluss des optischen Systems auf interferometrische Durchmesserbestimmungen von Silizium-Präzisionskugeln für das Avogadro-Projekt." 109. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO), Esslingen, 13-17, Mai, 2008, Deutschland ;
DGaO-Proceedings: 109 (2008), [online only], H3; Identifier:
www.dgao-proceedings.de/download/109/109_h3.pdf ; ISSN 1614-8436 ; Verlag Deutsche Gesellschaft für angewandte Optic, Erlangen
2007 - 2001
- Nicolaus, A.; Geckeler, R.:
"Improving the measurement of the diameter of Si spheres."
2006 Conference on Precision Electromagnetic Measurements (CPEM 2006), Torino, 09-14, July, 2006, Itlay;
in IEEE Transactions on Instrumentation and Measurement: 56 (2007), 2, 517 - 522;
Identifier:dx.doi.org/10.1109/TIM.2007.890619 ; ISSN 0018-9456 ; Verlag IEEE, New York
- Nicolaus, A.:
"Absolute density measurements by interferometrical diameter measurements of a silicon sphere."
Convegno Celebrativo Amedeo di Quaregna, Oropa, 09-11, June, 2002, Italy;
Atti del convegno celebrativo Amedeo Avogadro di Quaregna: (2006), 103 - 110;
Verlag Gallo Arti Grafiche, Vercelli - Nicolaus, A.; Fujii, K.:
"Primary calibration of the volume of silicon spheres."
Measurement Science and Technoly: 17 (2006), 10, 2527 - 2539;
Idenifier:dx.doi.org/10.1088/0957-0233/17/10/001 ; ISSN 0957-0233 (print) ; ISSN 1361-6501 (online);
Verlag IOP, Bristol
- Fujii, K.; Waseda, A.; Kuramoto, K.; Mizushima, S.; Becker, P.; Bettin, H.; Nicolaus, A.; Kuetgens, U.; Valkiers, S.;
Taylor, P.; De Biévre, P.; Mana, G.; Massa, E.; Matyi, R.; Kessler, E.; Hanke, M.:
"Present state of the Avogadro constant determination from silicon crystals with natural isotopic compositions."
2004 Conference on Precision Electromagnetic Measurements (CPEM), London, 27, June - 02, July, 2004, UK;
in IEEE Transactions on Instrumentation and Measurement: 54 (2005), 2, 854 - 859;
Identifier:dx.doi.org/10.1109/TIM.2004.843101 ; ISSN 0018-9456 ; Verlag IEEE, NJ - Nicolaus, A.; Elster, C.:
"Diameter determination of the Avogadro spheres #1 and #2."
2004 Conference on Precision Electromagnetic Measurements (CPEM), London, 27, June - 02, July, 2004, UK;
in IEEE Transactions on Instrumentation and Measurement: 54 (2005), 2, 872 - 876;
Identifier:dx.doi.org/10.1109/TIM.2005.843527 ; ISSN 0018-9456 ; Verlag IEEE, Piscataway, NJ - Nicolaus, A.; Bönsch, G.:
"Absolute volume determation of a silicon sphere with the spherical interferometer of PTB."
Metrologia: 42 (2005), 1, 24 - 31; Identifier:dx.doi.org/10.1088/0026-1394/42/1/003 ; ISSN 0026-1394 ; Verlag BIPM, Bristol
- Nicolaus, R. A.:
"Diameter determination of the Avogadro spheres #1 and #2."
2004 Conference on Precision Electromagnetic Measurements (CPEM), London, 27, June - 02, July, 2004, UK;
2004 Conference on Precision Electromagnetic Measurements (CPEM) Digest: (2004), 447 - 448;
Identifier:dx.doi.org/10.1109/CPEM.2004.305303 ; ISBN 0-7803-8493-8 ; Verlag IEEE, Piscataway, NJ - Fujii, K.; Waseda, A.; Kuramoto, K.; Mizushima, S.; Becker, P.; Bettin, H.; Nicolaus, A.; Kuetgens, U.; Valkiers, S.;
Taylor, P.; De Biévre, P.; Mana, G.; Massa, E.; Matyi, R.:
"Present state of the Avogadro constant determination from silicon crystals with natural isotopic composition."
2004 Conference on Precision Electromagnetic Measurements (CPEM), London, 27, June - 02, July, 2004, UK;
2004 Conference on Precision Electromagnetic Measurements Digest: (2004), 143 - 144;
Identifier:dx.doi.org/10.1109/TIM.2004.305501 ; ISBN 0-7803-8493-8 ; Verlag IEEE, Piscataway, NJ - Nicolaus, A. [speaker]; Schulz, M.; Weingärtner, I.:
"Messung ausgedehnter Wellenfronten mit einem Shack-Hartmann-Sensor."
105. Jahrestagung der DGaO (Deutsche Gesellschaft für angewandte Optik), Bad Kreuznach, 01-05, June, 2004, Germany;
DGaO-Proceedings: 105 (2004), [online only], A14; Identifier:www.dgao-proceedings.de/download/105/105_a14.pdf ;
ISSN 1614-8436 ; Verlag Deutsche Gesellschaft für angewandte Optik, Erlangen
- Becker, P.; Bettin, H.; Danzebrink, H.-U.; Gläser, M.; Kuetgens, U.; Nicolaus, A.; Schiel, D.; De Biévre, P.; Valkiers, S.; Taylor, P.:
"Determination of the Avogadro constant via the silicon route."
Metrologia: 40 (2003), 5, 271 - 287 ; Identifier:dx.doi.org/10.1088/0026-1394/40/5/010 ; stacks.iop.org/Met/40/271 ;
ISSN 0026-1394; IOP Verlag, Bristol
- Nicolaus, A.; Bönsch, G.:
"Accurate measurements of silicon spheres by interferometer."
Proceedings of the 3rd International Conference [and 4th General Meeting of the] European Society for Precision Engineering
and Nanotechnology. Vol. 2: (2002), 545 - 548 ; ISBN 90-386-2883-8 ; Verlag Universiteitsdr. TU Eindhoven - De Biévre, P.; Valkiers, S.; Kessel, R.; Taylor, P.; Becker, P.; Bettin, H.; Nicolaus, A.; Kuetgens, U.; Fujii, K.; Waseda, A.; Mana, G.;
Peuto, A.; Kenny, M. J.; Zosi, G.; Spaepen, F.:
"The Si-Route to the Avogadro constant: New measurements of the molar volume and lattice parameter in an integrated
international approach."
2002 Conference on Precision Electromagnetic Measurements (CPEM), Ottawa, 16-21, June, 2002, Canada;
2002 Conference on Precision Electromagnetic Measurements Digest: (2002), 290 - 291; ISBN 0-7803-7242-5 ; Verlag IEEE, Piscataway, NJ - Nicolaus, A.; Bönsch, G.:
"Volume of the Avogadro sphere: diameter determination with the sphere interferometer."
2002 Conference on Precision Electromagnetic Measurements (CPEM), Ottawa, 16-21, June, 2002, Canada;
2002 Conference on Precision Electromagnetic Measurements Digest: (2002), 296 - 297; ISBN 0-7803-7242-5 ; Verlag IEEE, Piscataway, NJ - Schödel, R.; Nicolaus, A.; Bönsch, G.:
"Phase stepping interferometry: Methods for reducing errors caused by camera nonlinearities."
Applied Optics: 41 (2002), 1, 55 - 63 ; ISSN 0003-6935; Verlag Washington DC, USA
- Weingärtner, I.; Schulz, M.; Geckeler, R.; Jusko, O.; Neugebauer, M.; Nicolaus, A.; Bönsch, G.:
"Tracing back radius of curvature and topography to the base unit of length with ultra-precision."
Conference on Recent Developments in Traceable Dimensional Measurments, 20-21, June, 2001, Munich, Germany ;
Conference on Recent Developments in Traceable Dimensional Measurments ; (Proceedings of SPIE: 4401): (2001), 175 - 183;
ISBN 0-8194-4096-5 ; ISSN 0277-786X ; Verlag SPIE, Bellingham, Wash.
2000 - 1991
- Nicolaus, A.; Bönsch, G.; Kang, C.-S.:
"Interferometrische Kalibrierverfahren für die Schrittweitensteuerung eines Phasenverschiebeinterferometers = Interferometric calibration procedures of the step-width control of a phase-stepping interferometer."
Technisches Messen: 67 (2000), 7 - 8, 328 - 333 ; ISSN 0171-8096 - Nicolaus, A.; Kang, C.-S.; Bönsch, G.:
"Interferometrische Selbstkalibrierung der Schrittweitenregelung in der Phasenverschiebungsinterferometrie." Tagung Sensoren und Messsysteme 2000, Ludwigsburg, 13-14, März, 2000, Deutschland
Sensoren und Messsysteme 2000 ; (VDI-Berichte: 1530): (2000), 287 - 296;
ISBN 3-18-091530-7 ; VDI-Verlag, Düsseldorf
- Kang, C.-S. [speaker]; Nicolaus, A.; Bönsch, G.:
"Automatic self-calibration of piezo systems in phase shifting Fizeau interferometers." CLEO/Pacific Rim ´99: the Pacific Rim Conference on Lasers and Electro-Optics, Seoul, 30, August - 03, -September, 1999, Korea; - Imkenberg, F. [speaker]; Nicolaus, A. [speaker]; Abou-Zeid, A.:
"Tuneable 633 nm diode lasers and application for phase stepping interferometry." Precision Engineering - Nanotechnology: 1st International Conference and General Meeting of the European Society for Precision Engineering and Nanotechnology (euspen), Bremen, 31, May - 04, June, 1999, Germany ; Precision engineering - nanotechnology: proceedings of the 1st International EUSPEN conference. Vol. 2 ;
CLEO/Pacific Rim ´99: the Pacific Rim Conference on Lasers and Electro-Optics: Technical digest: Vol. 2: (1999), 330 - 331 ;
ISBN 0-7803-5661-6, Verlag IEEE, Piscataway
(Berichte aus der Fertigungstechnik): (1999), 243 - 246; ISBN 3-8265-6085-X ; Verlag Aachen: Shaker
- Bönsch, G.; Potulski, E.:
"Measurement of the refractive index of air and comparison with modified Edlén´s formulae." Metrologia: 35 (1998), 2, 133 - 139 ; Identifier: - Nicolaus, A.; Kang, C.-S.; Bönsch, G.:
"Double-ended Fizeau interferometers with phase-stepping evaluation for measurements of cubes." Recent Developments in Optical Bauge Block Metrology, Proc. SPIE (1998): 3477, 109 - 115
dx.doi.org/10.1088/0026-1394/35/2/8 ;ISSN 0026-1394, Verlag BIPM, Sévres
- Bönsch, G.:
"Fit of Edlén´s formulae to measured values of the refractive index of air." Proc. SPIE (1998): 3477, 62 - 66 - Bönsch, G.; Nicolaus, A.:
"Doppelseitgie Fizeau-Interferometer mit Phasenverschiebeauswertung für dimensionelle Messungen." Technisches Messen: 3 (1998), 83 - 90
- Nicolaus, R. A.; Bönsch, G.:
"A Novel Interferometer for Dimensional Measurement of Silicon Sphere."
IEEE Transactions on Instrumentation and Measurement: 46 (1997), 2, 563 - 565;
Identifier:dx.doi.org/10.1109/19.571915 ; ISSN 0018-9456 ; Verlag IEEE, New York
- Becker, P.; Bettin, H.; Koenders, L.; Martin, J.; Nicolaus, A.; Röttger, S.:
"The silocon path to the kilogram." PTB-Mitteilungen: 106 (1996), 5, 321 - 329; ISSN 0030-834x ; Wirtschaftsverlag NW, Bremerhaven
- Nicolaus, A.:
"Auswertung von Fizeau-Interferenzen mit Hilfe der Phasenverschiebungsinterferometrie." PTB-OPT-41: 132 (1993); ISBN 389429-391-8
- Nicolaus, A.:
"Precise method to determining systematic errors in phase-shifting interferometry on Fizeau interferences." Applied Optics: Vol. 32 (1993), Iss. 31, 6380 - 63 86; Identifier:
dx.doi.org/10.1364/AO.32.006380 ; ISSN 0003-6935; Verlag Washington DC, USA- Nicolaus, A.:
"Optical testing by Fizeau phase-shifting interferometry." in "From Galileo´s Occhialino to Optoelectronics": (1993) 572 - 577; Paolo Mazzoldi Ed., World Scientific Publishing Co. Pte. Ltd.,
Singapore, New Jersey, London, Hong Kong ; ISBN 981-02-1332-8
- Nicolaus, A.:
"Evaluation of Fizeau interferences by phase-shifting interferometry." Optik 87: (1991), 1, 23 - 26; ISSN 0030-4026