Publications
- Dai, G., Hahm, K., Scholze, F. et al. 2014 Measurements of CD and sidewall profile of EUV photomask structures using CD-AFM and tilting-AFM, Meas. Sci. Tech., 25(4)
- Dai, G., Heidelmann, M., Kübel, C et al. 2013 Reference nano-dimensional metrology by scanning transmission electron microscopy, Meas. Sci. Tech., 24(8)
- Gaoliang Dai, Wolfgang Häßler-Grohne, Dorothee Hüser et al. 2012, New developments at Physikalisch Technische Bundesanstalt in three-dimensional atomic force microscopy with tapping and torsion atomic force microscopy mode and vector approach probing strategy, J. Micro/Nanolith. MEMS MOEMS 11(1), 011004
- Gaoliang Dai, Hans-Ulrich Danzebrink, Jens Fluegge and Harald Bosse, 2012 Quantitative characterisation of nanoimprinted structures using metrological large range AFM and CDAFM, Int. J. Nanomanufacturing 8, Nos. 5/6, 372-91
- Wolfgang Häßler-Grohne, Dorothee Hüser, Gaoliang Dai, et al. 2011 Investigation of the cantilever response of non-contact atomic force microscopy for topography measurements in all three dimensions, Meas. Sci. Technol. 22 094006
- Gaoliang Dai, Wolfgang Häßler-Grohne, Dorothee Hüser, et al. 2011 Development of a 3D-AFM for true 3D measurements of nanostructures, Meas. Sci. Technol. 22 094009
- Ichiko Misumi, Gaoliang Dai, Mingzi Lu et al. 2010 Bilateral comparison of 25 nm pitch nanometric lateral scales for metrologicalscanning probe microscopes. Meas. Sci. Technol. 21, 035105
- Gaoliang Dai, Helmut Wolff, Frank Pohlenz, et al. 2009 A metrological large range AFM with improved performance, Review of Scientific Instrument 80, 043702
- Gaoliang Dai, Sebastian Bütefisch, Frank Pohlenz, et al. 2009 A high precision micro/nano CMM using piezoresistive tactile probes, Meas. Sci. Technol. 20, 084001
- Gaoliang Dai, Sebastian Bütefisch, Frank Pohlenz et al. 2009 Rastersondenmetrologie: Vom metrologischen Rasterkraftmikroskop zum Mikro- und Nanokoordinatenmessgerät; Technisches Messen 76, 43-53
- M Xu, T Dziomba, G Dai et al. 2008 Self-calibration of scanning probe microscope: mapping the errors of the instrument, Measurement Science and Technology 19, 025105
- Gaoliang Dai, Helmut Wolff, Thomas Weimann, et al. 2007 Nanoscale surface measurements at sidewalls of nano and micro structures, Meas. Sci. Technol. 18, 334–41
- Gaoliang Dai, F Pohlenz, Thorsten Dziomba, Min Xu et al. 2007 Accurate and traceable calibration of two-dimensional gratings, Meas. Sci. Technol. 18, 415–21
- C G Frase, W Haessler-Grohne, G Dai et al. 2007 SEM linewidth measurements of anisotropically etched silicon structures smaller than 0.1 μm, Meas. Sci. Technol. 18, 439–47
- Gaoliang Dai, Helmut Wolff, and Hans-Ulrich Danzebrink 2007 Atomic force microscope cantilever based microcoordinate measuring probe for true three-dimensional measurements of microstructures, Appl. Phys. Lett. 91, 121912
- Gaoliang Dai, Frank Pohlenz, Min Xu et al. 2006 Accurate and traceable measurement of nano- and microstructures, Meas. Sci. Technol. 17, 545–52