Change in the management of the department
The management of the department has been transferred to Dr. Uwe Brand since 1.5.2019. The previous head, Dr. Ludger Koenders, has taken his retirement. We would like to thank him for many years of good management of the department.
Tasks and aims
Department 5.1 - "Surface Metrology"
- is responsible for the traceability of lengthsmeasurement and of parameters in surface metrology, i.e.
- for the calibration of step and depth setting standards
- for the calibration of roughness standards
- for the calibration of hardness reference blocks
- for the calibration of the layer thickness
- for the calibration of the resistant to bending of cantilevers and of the stiffness of micro-electromechanical systems (MEMS)
This Department …
- participates in the elaboration of standards and directives for surface metrology in national (VDI, DKD, DIN) and international committees (ISO, IMEKO),
- pursues and supports the development of standards and reference objects in the field of surface metrology, i.e. for tactile and optical procedures and for methods using scanning force microscopes, as well as for hardness and layer thickness metrology,
- is active in the field of research and development of new measuring instruments and measurement procedure as well as algorithms for the analysis and evaluation of data.
Research
Profilscanner with Si-microprobeFast surface measurements (roughness, E-module, hardness, deposits) with Si microprobes in injection nozzles.
- Light-induced force
- Proof of the theoretically predicted light attraction between coplanar plates with small distance.
- Mono-atomic step-height standards
- Processing procedure and measurement capabilities on mono-atomic steps on otherwise atomically smooth Si surfaces.
- Lateral resolution standards
- Geometry, manufacture, measurement and evaluation procedure of lateral resolution standards for microscopy and tactile measurement procedures.
- Software developement for roughness parameter determination
- Development of software for determination of the roughness parameters from surface measurements.
Working Groups
Hardness measurement techniques
Layer thickness and crystalline standards
Calibration of roughness parameters
Information
Informationes
Changings til 1.1.2018
The working group 5.14 "3D roughness measurement" leaded by Dr. Ludger Koenders will now be leaded by Dr. Dorothee Hüser-Espig.
Some reorganisations of the department since 1.1.2017:
Working group 5.11 "Hardness and Tactile Probing Methods" is renamed to "Tactile Probing Methods" and includes the nanoforce metrology (forme WG 5.12).
Working group 5.12 is now Hardness Measurement and includes macro hardness measurement.
This new structure is already build up in oure websites.
NanoScale 2016 Poland
from 9 to 11 of March 2016
The 11th Seminar on Quantitative Microscopy and the 7th Seminar on Nanoscale Calibration took place in March at the Worclaw University of Technology in Worclaw, Poland. It was organized by Prof. T. Gotzalk, Wroclaw University of Technology, President D. Habich of the Central Office of Measures/Glówny Urzad Miar (GUM) in Warszawa, Poland, the Nanometrology Group of the EURAMET TC-Length, and the Physikalisch-Technische Bundesanstalt, Braunschweig Germany. About 90 participants from the whole world were informed in 20 talks and more than 40 posters about the latest status of nanometrology.
