In ICT, the usable dynamic range of the X-ray images, i.e. the useful contrast, limits the maximum material thickness and the accuracy of the surface determination. In the EMPIR project "AdvanCT", various influences on the imaging, such as parasitic source regions and light scattering in the scintillator of the detector, were examined and model-based corrections implemented. This made it possible, for example, to determine the surfaces with an accuracy of 1/10 of the voxel size even with an...
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