The novel picoindenter from PTB, which uses the tip of an atomic force microscope (AFM) as an indenter to characterize nanomaterials dimensionally and mechanically, has now been decisively extended: In the "Laboratory for Emerging Nanometrology" (LENA) at TU-BS, pyramid-like Berkovich tips were produced on AFM cantilevers using a focused ion beam (FIB). These tips can also be used in the picoindenter. Compared to the conventional, conically shaped AFM tips, such indenters are mechanically more...
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