- An Electrically Conducting Three‐Dimensional Iron–Catecholate Porous Framework,
Andre Mähringer, Markus Döblinger, Matthias Hennemann, Christoph Gruber, Dominik Fehn, Patricia I. Scheurle, Pouya Hosseini, Irina Santourian, Alfred Schirmacher, Julian M. Rotter, Gunther Wittstock, Karsten Meyer, Timothy Clark, Thomas Bein, Dana D. Medina, Angewandte Chemie International Edition, doi = 10.1002/anie.202102670, Wiley,July 2021, 60, No. 33, 18065-18072 - BiRD - "Bidirectional Reflectance Definitions", a EURAMET EMPIR pre-normative project,
A. Schirmacher, T. Quast, DfwG-Report 2021/1: (2021), 54 - 62 - A. Ferrero, E. Perales, N. Basic, M. Pastuschek, G. Porrovecchio, A. Schirmacher, J.L. Velázquez, J. Campos, F.M. Martínez-Verdú, M. Smid, P. Linduska, T. Dauser, and P. Blattner:
Preliminary measurement scales for sparkle and graininess
Optics Express 7589, Vol. 29, No. 5 / 1 March 2021, doi.org/10.1364/OE.411953 - A. Ferrero, J. R. Frisvad, L. Simonot, P. Santafé, A. Schirmacher, J. Campos, and M. Hebert:
Fundamental scattering quantities for the determination of reflectance and transmittance
Optics Express, Vol. 29, Issue 1, pp. 219-231 (2021), doi.org/10.1364/OE.410225 - A. Ferrero, N. Basic, J. Campos, M. Pastuschek, E. Perales, G. Porrovecchio, M. Smid, A. Schirmacher, J.L.Velázquez, F.M. Martínez-Verdú:
An insight into the present capabilities of national metrology institutes for measuring sparkle
2020 Metrologia 57 065029, doi.org/10.1088/1681-7575/abb0a3 - B. Bernad, A. Ferrero, C. Strothkämper, J. Campos, A., Pons, T. Quast, K.-O. Hauer, A. Schirmacher:
Deviation of white diffuse reflectance standards from perfect reflecting diffuser at visible and near-infrared spectral ranges
Metrologia, Volume 56, No. 5, 2019 - A. Schirmacher, M. Pastuschek:
Zur Messung von Sparkle Eigenschaften
Vortrag auf der dfwg Jahrestagung 2018, Bönnigheim, 10. Okt. 2018, Dfwg-Report 2019/1, ISSN 1860-2835 - T. Quast, A. Schirmacher, K.-O. Hauer, A. Koo:
Polarization properties and microfacet-based modelling of white, grey and coloured matte diffuse reflection standards
NEWRAD 2017, Journal of Physics: Conf. Series 972 (2018) 012024, doi :10.1088/1742-6596/972/1/012024 - C. Strothkämper, A. Ferrero, A. Koo, P. Jaanson, G. Ged, G. Obein, S. Källberg, J. Audenaert, F. B. Leloup, F. M. Martínez-Verdú, E. Perales, A. Schirmacher, and J. Campos:
Multilateral spectral radiance factor scale comparison
Applied Optics 1996 Vol. 56, No. 7, March 1 2017 - Alfred Schirmacher, Tatjana Quast, Kai-Olaf Hauer:
Polarisationseffekte in gonioreflektorischen Messungen - Untersuchungen einer Auswahl verschiedener Proben
DfwG-Report: (2016), 3, 14 – 22, ISSN 1860-2835, DfwG-Jahrestagung 2016, Grimma, 04-06, Oktober, 2016, Deutschland - Buhr, Egbert; Schirmacher, Alfred; Höpe, Andreas:
Effektpigmente: Eine Herausforderung für die optische Messtechnik.
PTB-Mitteilungen, 125 (2015), 4, 39-44, dx.doi.org/10.7795/310.20150406
Fachverlag NW in der Carl Schünemann Verlag GmbH. ISSN 0030-834X - Strothkämper, Christian; Hauer, Kai-Olaf; Höpe, Andreas:
How to efficiently characterize special effect coatings.
Journal of the Optical Society of America A, 33 (2016), 1, 1-8,
dx.doi.org/10.1364/JOSAA.33.000001
ISSN 0740-3232 (print) ; ISSN 1520-8532 (online) - Cooksey, Catherine C.; Nadal, Maria E.; Allen, David W.; Hauer, Kai-Olaf; Höpe, Andreas:
Bidirectional reflectance scale comparison between NIST and PTB.
Applied Optics, 54 (2015), 13, 4006-4015, dx.doi.org/10.1364/AO.54.004006
Optical Society of America. ISSN 1559-128X (print) ; ISSN 1539-4522 (online) - Höpe, Andreas; Hauer, Kai-Olaf; Teichert, Sven; Hünerhoff, Dirk; Strothkämper, Christian:
Goniochromatic and sparkle properties of effect pigmented samples in multidimensional configuration.
Measuring, modeling and reproducing material appearance 2015 ; (Proceedings of SPIE: 9398)
(2015), 93980O-1-93980O-7, dx.doi.org/10.1117/12.2078727
- Höpe, Andreas; Hauer, Kai-Olaf; Teichert, Sven; Hünerhoff, Dirk; Strothkämper, Christian:
Goniochromatic and sparkle properties of effect pigmented samples in multidimensional configuration.
ohne schriftliche Quelle : no written source (2015)
- Höpe, Andreas; Koo, Annette; Verdú, Francisco; Leloup, Frédéric; Obein, Gael; Wübbeler, Gerd; Campos, Joaquín; Iacomussi, Paola; Jaanson, Priit; Källberg, Stefan; Smid, Marek:
Multidimensional reflectometry for industry : (xD-Reflect) an European research project.
Measuring, modeling, and reproducing material appearance : (Proceedings of SPIE: 9018) (2014),
901804-1-901804-11, dx.doi.org/10.1117/12.2035981
Bellingham, Wash. : SPIE.
- Höpe, Andreas; Forthmann, Carsten; Hauer, Kai-Olaf; Langovoy, Mikhail; Schmähling, Franko; Wübbeler, Gerd:
Virtual experiment uncertainty analysis of robot-based gonioreflectometers.
Proceedings of NEWRAD 2014 (2014), [Online only], 355-356,
newrad2014.aalto.fi/Newrad2014_Proceedings.pdf
- Höpe, Andreas; Hauer, Kai-Olaf; Bergner, Patrick; Ziegler, Tobias:
BRDF measurements at 254 nm for the LISA Pathfinder satellite mission.
Proceedings of NEWRAD 2014 (2014), [Online only], 326-328,newrad2014.aalto.fi/Newrad2014_Proceedings.pdf
- Höpe, Andreas; Koo, Annette; Forthmann, Carsten; Verdú, Francisco; Manoocheri, Farshid; Leloup, Frédéric; Obein, Gael; Wübbeler, Gerd; Ged, Guillaume; Campos, Joaquín; Hauer, Kai-Olaf; Yang, Li; Smid, Marek; Langovoy, Mikhail; Iacomussi, Paola; Jaanson, Priit; Källberg, Stefan:
xD-Reflect - "Multidimensional Reflectometry for Industry" a research project of the European Metrology Research Program (EMRP).
Proceedings of NEWRAD 2014 (2014), [Online only], 295-297, newrad2014.aalto.fi/Newrad2014_Proceedings.pdf