Logo PTB

X-ray Optics

Working Group 4.25


Lattice Parameters of Silicon

P. Becker, G. Cavagnero, U. Kuetgens, G. Mana, E. Massa: "Confirmation of IMGC and PTB Silicon Lattice Spacing Standards", IEEE Trans. on Instrumentation and Measurement 56 no 2 (2007) 5

P. Becker, H. Bettin, U. Kuetgens, B. Hallmann-Seifert, H. Riemann: "Silicon for primary metrology: The effect of hydrogen on its perfection", J. Phys. D: Appl. Phys. 38 (2005) 4109-4114

F. Alasia, G. Basile, P. Becker, U. Kuetgens, J. Stümpel, M. Servidori, J. Härtwig: "A Bragg-silicon lattice comparator", IEEE Trans. on Instrumentation and Measurement 50 (2001) 608-611

J. Martin, U. Kuetgens, J. Stümpel, P. Becker: "The silicon lattice parameter - an invariant quantity of nature?", Metrologia 35 (1998) 811-817

D. Windisch, P. Becker: "Lattice distortions induced by carbon in silicon", Phil. Mag. A 58 (1988) 435-443

H. Siegert, P. Becker, P. Seyfried: "Determination of silicon unit-cell parameters by precision measurements of Bragg plane spacings", Z. Phys. B 56 (1984) 273-278

P.Becker, K. Dorenwendt, G. Ebeling, R. Lauer, W. Lucas, R. Probst, H.-J. Rademacher, G. Reim, P. Seyfried, H. Siegert: "Absolute measurements of the (220) lattice plane spacing in a silicon crystal", Phys. Rev. Lett. 46 (1981) 1540-1543

X-ray Interferometer for anometrology

A. Yacoot, U. Kuetgens, L. Koenders, T. Weimann: "A combined scanning tunnelling microscope and X-ray interferometer [for grating structures calibration], Measurement Science & Technology 12 (2001) 1660-1665

Wang Lin, Li Dacheng, Cao Mang, L. Koenders, U. Kuetgens, P. Becker, "Angstrom ruler for high-accuracy pitch measurement", Applied Optics 39 (2000) 4535-4539

G. Basile, P. Becker, A. Bergamin, G. Cavagnero, A. Franks, K. Jackson, U. Kuetgens, G. Mana, E.W. Palmer, C.J. Robbie, M. Stedman, J. Stümpel, A. Yacoot, G. Zosi: "Combined optical and x-ray interferometry for high precision dimensional metrology", Proc. R. Soc. Lond. A 456 (2000) 701-729

U. Kuetgens, P. Becker: "X-ray Angle Interferometry: a practical set-up in the microrad range with nanorad resolution", Meas. Sci. Technol. 9 (1998) 1072-1075

D. Windisch, P. Becker: "Angular Measurements with X-ray Interferometry", J. Appl. Cryst. 25 (1992) 377-383

P. Becker, J. Stümpel: "X-ray optics in metrological applications", Metrologia 27 (1990) 127-132

Lattice Parameters of Silicon

Yu.V. Shvyd´ko, M. Lerche, U. Kuetgens, H.D. Rüter, A. Alatas, J. Zhao, J.: "X-ray Bragg diffraction in asymmetric backscattering geometry", Phys. Rev. Lett. 97 (2006) 235502/1-4

J.P. Sutter, T. Ishikawa, U. Kuetgens, G. Materlik, Y. Nishino, A. Rostomyan, K. Tamasaku, M. Yabashi: "An X-ray BBB Michelson interferometer", Journal of Synchrotron Radiation 11 (2004) 378-385

P. Becker, U. Bonse, A. Dettmer, F. Dubus, H. Rauch, M. Zawisky: "Neutron interferometer with very thin-lamellae", Cryst. Res. Technol. 36 (2001) 589-600

X-ray Interferometer for Nanometrology

M. Lucht, M. Lerche, H,-C. Wille, Yu. V. Shvyd´ko, H.D. Rüter, E. Gerdau, P. Becker: "Precise measurement of the lattice parameter of a-Al2O3 in the temperature range 4.5K - 250K using the Mößbauer wavelength standard", J. Appl. Cryst. 36 (2003) 1075-1081

Yu.V. Shvyd`ko, E. Gerdau, M. Lerche, M. Lucht, H.-C. Wille, E.E. Alp, P. Becker: "Sapphire x-ray resonators, First experiments and results", Hyperfine Interactions (C) 5 (2002) 25-28

Yu.V. Shvyd´ko, M. Lerche, J. Jäschke, M. Lucht, E. Gerdau, M. Gerken, H.D. Rüter, H.-C. Wille, P. Becker, E.E. Alp, W. Sturhahn, J. Sutter, T.S. Toellner: "g-ray wavelength standard for atomic scales", Phys.Rev. Lett. 85 (2000) 495-498

S. Kraft, J. Stümpel, P. Becker, U. Kuetgens: "High resolution x-ray absorption spectroscopy with absolute energy calibration for the determination of absorption edge energies", Rev. Sci. Instr. 67 (1996) 681-687

Other X-ray Interferometers and -monochromators

B. Andreas, U. Kuetgens, P. Becker: "Fast and easy Bragg reflex search for Berg-Barrett topography of misoriented crystals", J Appl. Cryst. (2008) 818-821

D. Windisch, P. Becker: "Lattice strain measurements in silicon micropositioning elements by x-ray topography", SPIE 1015 (1988) 81-86