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Publications

2020

•    Johannes Bautsch, Gerd Ehret, Markus Schake, Ulrich Berg, Lorenz Wagner, Johannes Pfund, Rainer Tutsch: Traceable calibration of Shack-Hartmann wavefront sensors employing spherical wavefronts, Optical Engineering 59 (8), pp. 084104-1-084104-10 (2020). doi.org/10.1117/1.OE.59.8.084104
•    Markus Schake, Gerd Ehret: Machine learning based fitting of Zernike polynomials for ASSI, DGaO Proceedings 2020. www.dgao-proceedings.de/download/121/121_a31.pdf
•    Gerd Ehret, Markus Schake, Michael Schulz: Kalibrierung von Wellenfrontsensoren mit ebenen und sphärischen Wellenfronten, DGaO Proceedings 2020. www.dgao-proceedings.de/download/121/121_p6.pdf
•    Marcel Lotzgeselle, Straub Andreas, Gerd Ehret, André Müller, Claas Falldorf, R. B. Bergmann, Iterative Bestimmung der Form von Asphären mittels Scher-Interferometrie und inversem Raytracing, DGaO Proceedings 2020. www.dgao-proceedings.de/download/121/121_p9.pdf
•    Jan Spichtinger, Michael Schulz, Gerd Ehret: Absolute distance interferometry for subaperture stitching of large freeform optics, European Optical Society Annual Meeting (EOSAM) 2020. doi.org/10.1051/epjconf/202023806011
•    Markus Schake, Jörg Riebeling, Gerd Ehret, Form deviations caused by lateral displacement errors in annular subaperture stitching interferometry, Optical Engineering 59 (12), pp. 1-17 (2020). doi.org/10.1117/1.OE.59.12.124105
•    Jan Spichtinger, Gerd Ehret, Michael Schulz: Optomechanical simulations of an advanced stitching interferometer set-up for large freeform optics, Proceedings of SPIE: 11552 (2020). doi.org/10.1117/12.2573704
•    Gerd Ehret, Jan Spichtinger, Manuel Stavridis, Michael Schulz: Setup of a new form measurement system for flat and slightly curved optics with diameters up to 1.5 metres, Proceedings of SPIE: 11478 (2020). doi.org/10.1117/12.2564912
•    Markus Schake, Gerd Ehret: Annular subaperture stitching interferometry with planar reference wavefront for measurement of spherical and aspherical surfaces, Proceedings of SPIE: 11523 (2020). doi.org/10.1117/12.2574754


2019

•    Jan Spichtinger, Gerd Ehret, Michael Schulz, Manuel Stavridis, Clemens Elster: Konzept für eine hochgenaue und rückgeführte optische Formmessung an großen Optiken bis 1,5 Meter, DGaO-Proceedings 2019. www.dgao-proceedings.de/download/120/120_p1.pdf
•    Johannes Bautsch, Gerd Ehret, Markus Schake, Ulrich Berg, Lorentz Wagner, Johannes Pfund: Charakterisierung von Wellenfrontsensoren mittels sphärischer Wellenfronten, DGaO-Proceedings 2019. www.dgao-proceedings.de/download/120/120_b12.pdf
•    Gerd Ehret, Michael Schulz: Vergleich unterschiedlicher Kleinwinkel-Deflektometrie-Verfahren zur Ebenheitsmessung, DGaO-Proceedings 2019, www.dgao-proceedings.de/download/120/120_b11.pdf
•    Jörg Riebeling, Gerd Ehret, Peter Lehmann: Optical form measurement system using a line-scan interferometer and distance measuring Interferometers for run-out compensation of the rotational object stage, Proceedings of SPIE 11056 (2019). doi.org/10.1117/12.2526033
•    Gerd Ehret, Heiko Reinsch, Michael Schulz: Interferometric and deflectometric flatness metrology with nanometre measurement uncertainties for optics up to 1 metre at PTB, Proceedings of SPIE: 11189 (2019). doi.org/10.1117/12.2538872
•    André F. Müller, Class Falldorf, G. Ehret, R. B. Bergmann: Messen von asphärischen Linsenformen mittels räumlicher Kohärenz = Measurement of aspherical lens forms using spatial coherence, Technisches Messen 86 (6), pp. 325-334 (2019). doi.org/10.1515/teme-2019-0025
•    Jan Spichtinger, Gerd Ehret, Michael Schulz, Manuel Stavridis, Clemens Elster: Konzept für eine hochgenaue und rückgeführte optische Formmessung an großen Optiken bis 1,5 Meter, 120. Jahrestagung der DGaO (2019). https://www.dgao-proceedings.de/download/120/120_p1.pdf


2018

•    Johannes Bautsch, Gerd Ehret, Ulrich Berg, Lorenz Wagner, Johannes Pfund: Hochgenaue und rückgeführte Charakterisierung von Wellenfrontsensoren, DGaO-Proceedings (2018). www.dgao-proceedings.de/download/119/119_p34.pdf
•    Sören Laubach, Gerd Ehret, Jörg Riebeling, Peter Lehmann: Konzept zur interferometrischen Formmessung mit einer nachgeführten Mehrzeilenkamera, DGaO-Proceedings 2018. www.dgao-proceedings.de/download/119/119_p4.pdf
•    Jan-Hendrik Hagemann, Claas Falldorf, Gerd Ehret, Ralf B. Bergmann: Form determination of optical surfaces by measuring the spatial coherence function u-sing shearing interferometry, Optics Express 26 (21), pp. 27991-28001 (2018). doi.org/10.1364/OE.26.027991
•    Sören Laubach, Gerd Ehret, Jörg Riebeling, Peter Lehmann: Design of an interferometric form measurement system with a tracked multi-line camera, The European Optical Society Biennial Meeting 2018 - EOSAM 2018 Proceedings: (2018). www.proceedings.com/42136.html
•    André F. Müller, Claas Falldorf, Mostafa Agour, Jan-Hendrik Hagemann, Gerd Ehret, Ralf B. Bergmann: Lens inspection using Multiple Aperture Shear Interferometry: comparison to wave front sensing methods, 119. DGaO Jahrestagung, DGaO Proccedings (2018). https://www.dgao-proceedings.de/download/119/119_a12.pdf


2017

•    Gerd Ehret, Sören Laubauch, Michael Schulz: Flatness metrology based on small-angle deflectometric procedures with electronic tiltmeters, Proc. of SPIE Vol. 10326, 1032604 (2017). doi.org/10.1117/12.2268288
•    S. Quabis, M. Schulz, G. Ehret, M. Asar, P. Balling, P. Křen, R. H. Bergmans, A. Küng, A. Lassila, D. Putland, D. Williams, H. Pirée, E. Prieto, M. Pérez, L. Svedova, Z. Ramotowski, M. Vannoni, F.: Intercomparison of flatness measurements of an optical flat at apertures of up to 150 mm in diameter, Metrologia 54 85–93 (2017). doi.org/10.1088/1681-7575/aa535c
•    Claas Falldorf, Jan-Hendrik Hagemann, Gerd Ehret, and Ralf B. Bergmann: Sparse light fields in coherent optical metrology, Applied Optics 56 (13), pp. F14-F19 (2017). doi.org/10.1364/AO.56.000F14
•    Gerd Ehret, Sören Laubach, Michael Schulz: Verbesserte deflektometrische Ebenheitsmetrologie an großen Optiken durch den Ein-satz von elektronischen Neigungssensoren, DGaO-Proceedings (2017). www.dgao-proceedings.de/download/118/118_p24.pdf
•    A. Straub, S. Laubach, G. Ehret, M. Stavridis, F. Schmähling, C. Elster: Rekonstruktionsalgorithmus zur genaueren Bestimmung der 3D-Topographie bei einem scannenden optischen Punktsensor, DGaO-Proceedings (2017). www.dgao-proceedings.de/download/118/118_p22.pdf
•    Johannes Bautsch, Jan-Hendrik Hagemann, Gerd Ehret: Shearing-Interferometer mit unterschiedlich kohärenten Multilichtquellen zur optischen Formmessung optischer Oberflächen, DGaO-Proceedings (2017). www.dgao-proceedings.de/download/118/118_p23.pdf
•    Gerd Ehret, Sören Laubach, Michael Schulz: Flatness metrology based on small-angle deflectometric procedures with electronic tiltmeters, Proceedings of SPIE: 10326 (2017). doi.org/10.1117/12.2268288
•    Jan-Hendrik Hagemann, Claas Falldorf, Gerd Ehret, Ralf B. Bergmann: Error influences of the shear element in interferometry for form characterization of optics, Proceedings of SPIE: 10329 (2017). doi.org/10.1117/12.2269932
•    Sören Laubach, Gerd Ehret, Jörg Riebling, Peter Lehmann: Combination of a fast white-light interferometer with a phase shifting interferometric line sensor for form measurements of precision components, Proceedings of SPIE: 10329 (2017), doi.org/10.1117/12.2269520
•    Sören Laubach, Gerd Ehret, Peter Lehmann und Jörg Riebeling: Interferometrischer Liniensensor zur Formmessung von rotationssymmetrischen optisch glatten Oberflächen = Interferometric line sensor for form measurement of rotationally symmetric optical smooth surfaces, Technisches Messen 84 (2017), 3, 166-173, doi.org/10.1515/teme-2016-0067


2016

•    Gerd Ehret, Susanne Quabis, Michael Schulz: Small-angle deflectometry with coherent and incoherent illumination, DGaO Proceedings 2016, www.dgao-proceedings.de/download/117/117_p36.pdf
•    Gerd Ehret, Sören Laubach, Andreas Straub, Michael Schulz: Form measurement of large optics with deflectometric and interferometric procedures at PTB, Third European Seminar on Precision Optics Manufacturing, (Proceedings of SPIE: 10009): (100090B-1 - 100090B), 2016. dx.doi.org/10.1117/12.2235474
•    Gerd Ehret, Susanne Quabis, Michael Schulz: Comparison of small angle deflectometric measurements with different apertures down to the sub-millimetre range, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, Proceedings of SPIE 9687, pp. 968702-1 - 968702-8, (2016). dx.doi.org/10.1117/12.2243608
•    Sören Laubach, Gerd Ehret, Jörg Riebeling, Peter Lehmann: A new form measurement system based on sub-aperture stitching with a line-scanning interferometer, Advanced Optical Technologies (2016), doi.org/10.1515/aot-2016-0039
•    Gerd Ehret, Susanne Quabis, Michael Schulz: Small-angle deflectometry with coherent and incoherent illumination, DGaO-Proceedings 117 (2016). www.dgao-proceedings.de/download/117/117_p36.pdf
•    A. Straub, S. Laubach, G. Blobel, G. Ehret: Optical form measurements with a scanning point sensor in null configuration, DGaO-Proceedings 117 (2016). www.dgao-proceedings.de/download/117/117_p67.pdf
•    A. Straub, S. Laubach, G. Blobel, G. Ehret: Realization of a shearing interferometer with LED multipoint illumination for form characterization of optics, DGaO-Proceedings 117 (2016). www.dgao-proceedings.de/download/117/117_p67.pdf
•    S. Laubach, G. Ehret, J. Riebeling, P. Lehmann, Error analysis of an interferometric line-based form measuring system, DGaO-Proceedings 117 (2016). www.dgao-proceedings.de/download/117/117_p66.pdf
•    J.-H. Hagemann, G. Ehret, B. Andreas, R. B. Bergmann, C. Falldorf, Virtual shearing interferometer with LED illumination for form characterization of optics, Proceedings of European Optical Society Annual Meeting 2016. www.proceedings.com/36165.html
•    Gerd Ehret, Sören Laubach, Andreas Straub, Michael Schulz: Form measurement of large optics with deflectometric and interferometric procedures at PTB, Proceedings of SPIE: 10009 (2016). doi.org/10.1117/12.2235474
•    Gerd Ehret, Susanne Quabis, Michael Schulz: Comparison of small angle deflectometric measurements with different apertures down to the sub-millimetre range, Proceedings of SPIE 9687 (2016). doi.org/10.1117/12.2243608


2015

•    S. Laubach, G. Ehret, H. Knell, P. Kühnhold, P. Lehmann: Calibration strategies for a new fast line-based form measuring system, DGaO-Proceedings (2015). www.dgao-proceedings.de/download/116/116_p5.pdf
•    Gerd Ehret, Michael Schulz, Susanne Quabis: Small angle deflectometer with submillimeter lateral resolution for flatness measure-ments of optics, Proceedings of the 12th International Conference on Synchrotron Radiation Instrumentation - SRI 2015 (AIP conference proceedings: 1741) (2016). doi.org/10.1063/1.4952891


2014

•    S. Laubach, G. Ehret, H. Knell, P. Kühnhold, P. Lehmann: Stitching streifenförmiger Subaperturen zur Formmessung, DGaO-Proceedings (2014). www.dgao-proceedings.de/download/115/115_a20.pdf
•    Claas Falldorf, Gerd Ehret, Michael Schulz, Ralf B. Bergmann: Wave front characterization of Gaussian beams using shear interferometry and a weighted reconstructor, DGaO-Proceedings (2014). www.dgao-proceedings.de/download/115/115_a11.pdf
•    Holger Knell, Sören Laubach, Gerd Ehret, and Peter Lehmann: Continuous measurement of optical surfaces using a line-scan interferometer with si-nusoidal path length modulation, Optics Express 22 (2014), 24, 29787-29798, doi.org/10.1364/OE.22.029787
•    P. Kühnhold, H. Knell, P. Lehmann, S. Laubach, G. Ehret: Mikroskop-basierter interferometrischer Zeilensensor zum schnellen Scannen optischer Funktionsflächen, XXVIII. Messtechnisches Symposium des Arbeitskreises der Hochschullehrer für Messtechnik e.V : Tagungsband (2014), pp. 45-54. doi.org/10.5162/AHMT2014/2.2
•    Gerd Ehret, Susanne Quabis, Michael Schulz, Birk Andreas, Ralf D. Geckeler: New sensor for small angle deflectometry with lateral resolution in the sub-millimetre range, Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology (2014), 887-890. doi.org/10.1007/978-3-642-36359-7_165
•    Sören Laubach, Gerd Ehret, Holger Knell, Peter Kühnhold, Peter Lehmann: A novel form measurement system for precision components using interferometric sub-aperture stitching, Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology (2014), 903-906. doi.org/10.1007/978-3-642-36359-7_169
•    Claas Falldorf, Aleksandar Simic, Gerd Ehret, Michael Schulz, Christoph von Kopylow, Ralf B. Bergmann: Precise optical metrology using computational shear interferometry and an LCD moni-tor as light source, Fringe 2013: 7th International Workshop on Advanced Optical Imaging and Metrology (2014), 729-734, doi.org/10.1007/978-3-642-36359-7_134


2013

•    Gerd Ehret, Susanne Quabis, Michael Schulz, Birk Andreas, Ralf D. Geckeler: Sensorentwicklung zur deflektometrischen Topografiemessung mit sub-Millimeter Aperturen, DGaO-Proceedings 114 (2013). www.dgao-proceedings.de/download/114/114_a3.pdf
•    Sören Laubach, Gerd Ehret: Weißlichtinterferometrie für die Formmessung, DGaO-Proceedings 114 (2013). www.dgao-proceedings.de/download/114/114_p21.pdf
•    Michael Schulz, Susanne Quabis, Gerd Ehret: Internationaler Vergleich zur Topographiemessung an einer Planfläche, DGaO-Proceedings 114 (2013). www.dgao-proceedings.de/download/114/114_p1.pdf
•    Gerd Ehret, Michael Schulz, Maik Baier, Arne Fitzenreiter: Optical measurement of absolute flatness with the deflectometric measurement systems at PTB, Journal of Physics: Conference Series 425 (2013), 1-4. doi.org/10.1088/1742-6596/425/15/152016


2012

•    G. Ehret, M. Schulz, M. Stavridis and C Elster: Deflectometric systems for absolute flatness measurements at PTB, Measurement Science and Technology 23 (2012), 9, 094007-1-094007-8, doi.org/10.1088/0957-0233/23/9/094007
•    Gerd Ehret, Michael Schulz: Difference deflectometry with coupling mirrors for flatness measurements of rough or scattering surfaces, DGaO-Proceedings (2012). www.dgao-proceedings.de/download/113/113_p27.pdf
•    Gerd Ehret, Birk Andreas: Realization of bessel beams using diffractive chrome structures, EOS Annual Meeting 2012 (EOSAM 2012) (2012)
•    Michael Schulz, Gerd Ehret, Petr Křen: High accuracy flatness metrology within the European Metrology Research Program, Nuclear Instruments and Methods in Physics Research A 710 (2012), 37-41. doi.org/10.1016/j.nima.2012.10.112


2011

•    Axel Wiegmann, Manuel Stavridis, Monika Walzel, Frank Siewert, Thomas Zeschke, Michael Schulz Clemens Elster: Accuracy evaluation for sub-aperture interferometry measurements of a synchrotron mirror using virtual experiments, Prec. Eng. 35, 183-190 (2011). doi.org/10.1016/j.precisioneng.2010.08.007
•    Axel Wiegmann, Michael Schulz, Clemens Elster: Absolute Profilmessung optischer Oberflächen mit Mehrfachsensorsystemen, tm – Technisches Messen, 78, 184-189 (2011) , doi.org/10.1524/teme.2011.0102
•    Gerd Ehret, Michael Schulz, Maik Baier, Arne Fitzenreiter, Wolfgang Jöckel, Manuel Stavridis, Clemens Elster: Virtuelle und reale Experimente am neuen deflektometrischen Ebenheitsstandard, DGaO-Proceedings 112 (2011), www.dgao-proceedings.de/download/112/112_a4.pdf
•    Jörg Seewig, Gerd Ehret: Unsicherheitsbetrachtungen zur Formmessung an optischen Bauelementen auf der Basis von Bayes, Messunsicherheit praxisgerecht bestimmen: Erfurt, 8. und 9. November 2011 ; (VDI-Berichte: 2149) (2011), 63-71
•    Gerd Ehret, Michael Schulz, Arne Fitzenreiter, Maik Baier, Wolfgang Jöckel, Manuel Stavridis, Clemens Elster: Alignment methods for ultraprecise deflectometric flatness metrology, Proceedings of SPIE: 8082 (2011). doi.org/10.1117/12.889325
•    Gerd Ehret, Michael Schulz et al. Optische und taktile Oberflächencharakterisierung auf der nm-Skala, PTB-Mitteilungen 121 (2011), 2, 142-151
•    G. Ehret, M. Schulz, A. Wiegmann, M. Stavridis, C. Elster: Flatness measurements with the deflectometric flatness reference at PTB, Proceedings of the 11th International Conference of the European Society for Precision Engineering and Nanotechnology 1 (2011), 154-157, www.euspen.eu/knowledge-base/ICE11140.pdf
•    Michael Schulz, Gerd Ehret, Maik Baier, Arne Fitzenreiter: Deflectometric measurement of flat and slightly curved optical surfaces with improved lateral resolution, 10th IMEKO Symposium Laser Metrology for Precision Measurement and Inspection in In-dustry (LMPMI) 2011 : (VDI-Berichte: 2156) (2011), 113-118


2010

•    Michael Schulz, Gerd Ehret, Arne Fitzenreiter: Scanning deflectometric form measurement avoiding path-dependent angle measurement errors, Journal of the European Optical Society: Rapid Publications 5 10026-1 - 10026-4 (2010). doi.org/10.2971/jeos.2010.10026
•    Gerd Ehret, Michael Schulz, Maik Baier, Arne Fitzenreiter, Manuel Stavridis, Clemens Elster: Vergleich von hochgenauen deflektometrischen Verfahren für die Ebenheitsmetrologie, DGaO-Proceedings (2010). www.dgao-proceedings.de/download/111/111_a20.pdf
•    Axel Wiegmann, Michael Schulz, Clemens Elster: Improving the lateral resolution of a multisensor profile measurement method by nonequidistant sensor spacing, Optics Express 18, 15, 15807 – 15819 (2010). doi.org/10.1364/OE.18.015807
•    Michael Schulz, Gerd Ehret, Manuel Stavridis, Clemens Elster: Concept, design and capability analysis of the new Deflectometric Flatness Reference at PTB, Nuclear Instruments and Methods in Physics Research A Volume 616 (2-3), pp. 134-139, (2010). doi.org/10.1016/j.nima.2009.10.108
•    Michael Schulz, Gerd Ehret, Manuel Stavridis, Clemens Elster: Characteristics of the new Deflectometric Flatness Reference at PTB, Proceedings of the 10th International Conference of the European Society for Precision Engineering and Nanotechnology 1 (2010), 108-111, https://www.euspen.eu/knowledge-base/ICE10134.pdf


before 2010 (a selection on flatness metrology)

•    Gerd Ehret, Michael Schulz, Maik Baier, Arne Fitzenreiter: A new optical flatness reference measurement system, 110. Jahrestagung der Deutschen Gesellschaft für angewandte Optik (DGaO), Brescia, 02-05, Juni, (2009). www.dgao-proceedings.de/download/110/110_p22.pdf
•    Gerd Ehret,  Michael Schulz, Manuel Stavridis, Clemens Elster: A new flatness reference measurement system based on deflectometry and difference deflectometry, Fringe 2009: 6th International Workshop on Advanced Optical Metrology (2009), 318-323. doi.org/10.1007/978-3-642-03051-2_52
•    Axel Wiegmann, Michael Schulz, Clemens Elster: Suppression of aliasing in multi-sensor scanning absolute profile measurement, Optics Express, Vol. 17, Issue 13, pp. 11098-11106 (2009). doi.org/10.1364/OE.17.011098
•    Michael Schulz, Andrés Márques, Axel Wiegmann, Clemens Elster: Direkte Kalibrierung flächenmessender Interferometer mit dem TMS-Verfahren, DGaO-Proceedings (2008), www.dgao-proceedings.de/download/109/109_a6.pdf
•    Michael Schulz, Axel Wiegmann, Andrés Márquez, Clemens Elster:    Optical flatness metrology: 40 years of progress, Opt. Pura Apl. 41 (4) 325-331 (2008). www.sedoptica.es/Menu_Volumenes/Pdfs/314.pdf
•    Axel Wiegmann, Michael Schulz, Clemens Elster: Absolute profile measurement of large moderately flat optical surfaces with high dynamic range, Optics Express Vol. 16(16) pp. 11975-11986 (2008). doi.org/10.1364/OE.16.011975
•    R. D. Geckeler: ESAD shearing deflectometry: A primary flatness standard with sub-nanometer uncertainty, Key Engineering Materials: 381/382, pp. 543 – 546 (2008) www.scientific.net/KEM.381-382.543.pdf
•    Michael Schulz, Andrés Márquez, Axel Wiegmann, Clemens Elster, Direkte Kalibrierung flächenmessender Interferometer mit dem TMS-Verfahren, DGaO-Proceedings (2008) www.dgao-proceedings.de/download/109/109_a6.pdf
•    Axel Wiegmann, Clemens Elster, Michael Schulz, Manuel Stavridis:    Absolute Topographievermessung gekrümmter optischer Oberflächen mit hoher lateraler Auflösung, DGaO-Proceedings (2008). www.dgao-proceedings.de/download/109/109_p28.pdf
•    R. D. Geckeler: Optimal use of pentaprisms in highly accurate deflectometric scanning, Meas. Sci. Technol. 18, pp. 115-125 (2007). doi.org/10.1088/0957-0233/18/1/014
•    R. D. Geckeler , A. Just: Optimized Use and Calibration of Autocollimators in Deflectometry: Proc. SPIE 6704, 670407-1-12, (2007). doi.org/10.1117/12.732384
•    A. Wiegmann, C. Elster, R. D. Geckeler, M. Schulz: Stability analysis for the TMS method: Influence of high spatial frequencies, Proc. SPIE 6616, 661618-1-9 (2007). doi.org/10.1117/12.726116
•    R. D. Geckeler: Theorie und experimentelle Ergebnisse zur optimalen Justage von Pentaprismen, DGaO-Proceedings (2007). www.dgao-proceedings.de/download/108/108_p38.pdf
•    R. D. Geckeler, A. Just: Optimaler Einsatz und Kalibrierung von Autokollimatoren zur Formmessung mittels hochgenauer Deflektometrie, DGaO-Proceedings (2007). www.dgao-proceedings.de/download/108/108_a3.pdf
•    A. Wiegmann, C. Elster, R. D. Geckeler, M. Schulz,    Stabilitätsanalyse für das TMS Verfahren: Einfluss hoher Ortsfrequenzen des Prüflings, DGaO-Proceedings (2007). www.dgao-proceedings.de/download/108/108_p34.pdf
•    M. Schulz, A. Wiegmann, C. Elster:    Weiterentwicklung des TMS-Verfahrens zur hochauflösenden und hochgenauen optischen Formmessung, DGaO-Proceedings (2007). www.dgao-proceedings.de/download/108/108_a4.pdf
•    M. Schulz, C. Elster: Traceable multiple sensor system for measuring curved surface profiles with high accuracy and high lateral resolution, Opt. Eng. 45, 060503 (2006). doi.org/10.1117/1.2208568
•    M. Schulz, J. Gerhardt, R. D. Geckeler, C. Elster: Traceable Multiple Sensor System for Absolute Form Measurement, Proc. SPIE 5878 pp. 84-91 (2005). doi.org/10.1117/12.614726
•    M. Schulz: Traceable Multiple Sensor Systems for High-Accuracy Form Measurement, DGaO-Proceedings (2005), www.dgao-proceedings.de/download/106/106_p10.pdf
•    J. Illemann, A. Just: Absolute deflectometric measurement of topography – influence of systematic deviations, Proc. SPIE 5457, pp. 689-700 (2004). doi.org/10.1117/12.545666
•    C. Elster, I. Weingärtner: High-accuracy reconstruction of a function f(x) when only d/dx f(x) or d²/dx² f(x) is known at discrete measurement points, Proc. SPIE  4782, 153 – 160 (2002). doi.org/10.1117/12.450459
•    I. Weingärtner, M. Schulz, C. Elster: Novel scanning technique for ultra-precise measurement of  topography, Proc. SPIE 3782, pp. 306 – 317 (1999). doi.org/10.1117/12.369198
•    M. Schulz, I. Weingärtner: Avoidance and elimination of errors in optical scanning and Inspection, Proc. SPIE 3823, pp. 133 – 141 (1999). doi.org/10.1117/12.360981
•    C. Elster, I. Weingärtner, Solution to the shearing problem, Appl. Optics, 38, 5024 – 5031 (1999). doi.org/10.1364/AO.38.005024
•    E. Debler, K. Zander: Ebenheitsmessungen an optischen Planflächen mit Autokollimationsfernrohr und Pentagonprisma, PTB-Mitteilungen, 90. Jahrgang, pp. 339-349 (1980).
•    R. Bünnagel, H.A. Oehring, K. Steiner: Fizeau Interferometer for Measuring the Flatness of Optical Surfaces, Appl. Optics Vol 7(2), pp. 331-335 (1968). doi.org/10.1364/AO.7.000331
•    R. Bünnagel: Ein verbesserter erschütterungsunempfindlicher Quecksilberspiegel als Ebenheitsnormal, Z. Instr. Kde.73, 214-215 (1965).
•    R. Bünnagel: Herstellung und Verwendung eines gegen Erschütterungen unempfindlichen Hg-Spiegels als Ebenheitsnormal, Optica Acta 3 Nr. 2, pp. 81-84 (1956).