Selected References:
[1] I. Fortmeier, M. Stavridis, A. Wiegmann, M. Schulz, W. Osten, C. Elster, Evaluation of absolute form measurements using a tilted-wave interferometer, Optics Express 24(4) (2016), pp. 3393-3404.
[2] I. Fortmeier, M. Stavridis, A. Wiegmann, M. Schulz, W. Osten, C. Elster, Analytical Jacobian and its application to tilted-wave interferometry, Optics Express 22(18) (2014), pp. 21313--21325.
[3] I. Fortmeier, M. Stavridis, A. Wiegmann, Verfahren zum Optimieren eines simulierten optischen Systems, Deutsches Patentamt, DE102014001323 B4, 2014.
[4] I. Fortmeier, M. Stavridis, A. Wiegmann, M. Schulz, G. Baer, C. Pruss, W. Osten, C. Elster, Results of a Sensitivity Analysis for the Tilted-Wave Interferometer, Osten, W. (ed.): Fringe 2013, Springer, (2014), pp. 701--706.
[5] I. Fortmeier, M. Stavridis, A. Wiegmann, M. Schulz, G. Baer, C. Pruss, W. Osten, C. Elster, Sensitivity analysis of tilted-wave interferometer asphere measurements using virtual experiments, Proceedings of SPIE 8789 (2013), pp. 878907.