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[2] M. Schulz, C.Elster (2006). Tracable multiple sensor system for measuring curved surface profiles with high accuracy and high lateral resolution. Opt. Eng. 45, 060503.
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[4] M. Schulz, A. Marquez, A.Wiegmann, C. Elster (2008). Direkte Kalibrierung flächenmessender Interferometer mit dem TMS-Verfahren. DGaO Proceedings 2008. [download pdf (921KB)] (in german)
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download link: http://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-18-15-15807
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