Annular subaperture stitching interferometry (ASSI) is a common approach for the measurement of aspherical surfaces. A common obstacle of ASSI is the occurrence of lateral displacement errors when the sensor or specimen is repositioned between the subaperture measurements. Our contribution focuses on modeling of the statistical displacement errors. Avirtual experiment is presented simulating the propagation of the displacement errors through a cumulative and a global stitching algorithm to the retrieved surface form. For the considered experimental setup, the uncertainty in lateral position depends on the positioning uncertainties of the employed motion system and the uncertainty in the absolute distance measurement between the sensor and specimen. The lateral displacement uncertainty is determined experimentally employing a calibratable lateral grating. Thus, it is traceable to the SI unit of the length (meter). The experimental...

The challenges faced in a comparison of measuring the detection efficiency of free-running InGaAs/InP single-photon avalanche detectors (InGaAs/InP SPAD) were studied by four European National Metrology Institutes (NMIs) meeting at a single laboratory. The main purpose of this study is to develop a trustable measurement technique and to provide a snapshot of the methods used by the four NMIs for measuring such photon-counting detectors at telecom wavelengths in order to establish proper procedures for characterising such devices. The detection efficiency measurements were performed using different experimental setups and reference standards with independent traceability chains at the wavelength of 1550 nm. A dedicated model to correct the dead time and dark count effects on the SPAD’s free-running counting process was developed, allowing the correct value of the photon rate impinging on the detector to be recovered from simple ratemeter...

We report on the characterization of the angular-dependent emission of single-photon emitters based on single nitrogen-vacancy (NV-) centers in nanodiamond at room temperature. A theoretical model for the calculation of the angular emission patterns of such an NV-center at a dielectric interface will be presented. For the first time, the orientation of the NV-centers in nanodiamond was determined from back focal plane images of NV-centers and by comparison of the theoretical and experimental angular emission pattern. Furthermore, the orientation of the NV-centers was also obtained from measurements of the fluorescence intensity in dependence on the polarization angle of the linearly polarized excitation laser. The results of these measurements are in good agreement. Moreover, the collection efficiency in this setup was calculated to be higher than 80 % using the model of the angular emission of the NV-centers.