
Committees
Automatic RF Techniques Group, Executive Committee (2003-2009)
IEEE Workshop on Signal Propagation on Interconnects, Standing Committee
MTT-11 Microwave Measurements Technical Committee
TTTC-TEG Test Technology Educational Program Committee
National URSI Commission, Germany
Commission A: Electromagnetic Metrology
International Conferences (Program Chair)
- IEEE Workshop on Signal Propagation on Interconnects SPI 2010
- IEEE Workshop on Signal Propagation on Interconnects SPI 2006
- IEEE Workshop on Signal Propagation on Interconnects SPI 2005
- IEEE Workshop on Signal Propagation on Interconnects SPI 2004
- 69th ARFTG Conference: RF Measurements for a Wireless World
Addressing Metrology Needs for Future High-Speed Information and Communication Systems
Scientific Workshops, Tutorials and Short Courses
- IEEE International Microwave Symposium IMS 2011
Workshop - Laboratory Class: Wafer-Level S-Parameter Calibration Techniques - 76th ARFTG Conference (Nov. 2010):
mm- and Submm-wave Measurements and Modeling
NIST/ARFTG Short Course: Uncertainties in On-Wafer S-Parameter Measurements - 74th ARFTG Conference (Dec. 2009):
System Modeling and Measurement for High Accuracy Verification
NIST/ARFTG Short Course: Uncertainties in On-Wafer S-Parameter Measurements - IEEE European Microwave Conference EuMC 2008
Workshop WMO-3: Determining and Dealing with Errors in Microwave Measurements: Characterizing Planar Standards for Wafer-Level Calibration - IEEE European Microwave Conference EuMC 2007
Workshop WSF-13: Determining Accuracy of Measurements at High Frequencies: Traceability for On-Wafer S-Parameter Measurements - Joint NERG/MTT-11 Meeting 2006
Wideband On-Wafer Characterization of High-Speed Interconnects - EEEfCOM Workshop 2005
Breitbandige On-Wafer-Messverfahren für High-Speed-Interconnects - IEEE International Microwave Symposium IMS 2005
Workshop on On-Wafer Microwave Measurements - State of the Art and Future Directions - IEEE International Microwave Symposium IMS 2004
Workshop on Statistical Methods and Analysis for Microwave Measurements - 8th IEEE IEEE Workshop on Signal Propagation on Interconnects SPI 2004
VLSI Interconnect Characterization: Fundamentals, Modeling, and On-Wafer Measurements - 7th IEEE IEEE Workshop on Signal Propagation on Interconnects SPI 2003
On-Wafer Measurement Techniques for High-Speed Interconnect Characterization IEEE International Microwave Symposium IMS 2003
Workshop on Multiport/Multimode Measurements & Related ApplicationsIEEE International Microwave Symposium IMS 2002
Workshop on Differential Device Characterization and Modeling- 58th ARFTG Conference: RF Measurements for a Wireless World (11/2001)
ARFTG/NIST Short Course -- Broadband Measurements of VLSI Interconnects