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Fundamentals of Scattering Parameter Measurements

Working Group 2.23


Scattering parameters or S-parameters are the most commonly used tool in microwave network analysis. Since in microwave circuits conventional currents and voltages do not always exist, scattering parameters are defined via forward and backward traveling waves. Scattering parameters are most commonly measured by vector network analyzers. Vector network analyzers must be calibrated before they can measure scattering parameters accurately.

The working group Fundamentals of Scattering Parameter Measurements investigates possibilities to increase both the frequency range and the range of applications of classic S-parameter measurement techniques. The focus is currently on the development of traceable S-parameter measurements for planar circuits and components (on-wafer microwave measurements, EMPIR Project PlanarCal). Further activities include the development of wideband measurement of dielectric properties of substrates at RF and Microwave frequencies and the electromagnetic characterisation of interconnects in microelectronics and RF industry.

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Related activities


  • IEEE Workshop on Signal Propagation on Interconnects, Standing Committee
  • MTT-11 Microwave Measurements Technical Committee
  • National URSI Commission A: Electromagnetic Metrology

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