Raman microscopy is a measurement procedure for the spatially resolved determination of the chemical composition of samples. A new PTB Raman standard allows Raman microscopes to be calibrated laterally and their optical resolution to be performed with particularly high quality. It consists of a silicon surface (a material with excellent Raman activity) which is almost free of topography, to which very thin gold-palladium patterns have been applied in a coating procedure. These covers effect an attenuation of the Raman signal.