Logo of the Physikalisch-Technische Bundesanstalt
Symbolbild "News"

Extrapolating the actual quantities based on findings: a case for mathematicians

PTB is developing mathematical evaluation methods for the nondestructive measurement of nanostructures

06.05.2009

If the guilt of the accused cannot be proven directly, then evidence can help. Experts of accurate measurement also must similarly proceed indirectly more and more often: If it is not possible to measure a measurand directly, then other quantities must be measured and the actual quantity of interest extrapolated with the aid of intelligent computer programmes. Scientists of the Physikalisch-Technische Bundesanstalt (PTB) are proceeding in this same manner, together with partners in a joint project of the Bundesforschungsministerium (BMBF - Federal Ministry of Research). The matter involved is the measurement of increasingly smaller computer components and other industrial structures which are only nanometer-sized and thus can no longer be examined with the classic light-microscopic method. A new method for examining such structures is by using scatterometry. Light is scattered thereby at periodic nanostructures and the dimensions of the specimen are extrapolated from the characteristics of the scattered light. The project partners have now developed a mathematical model and a so-called inverse method which enable such measurements to be carried out with great accuracy.

Links: Messschema zur scatterometrischen Oberflächencharakterisierung. Typische Messobjekte sind Photomasken; Rechts: Ergebnis einer Profilrekonstruktion. Für das berechnete optimale Profil werden die gemessenen mit den berechneten Streuintensitäten verglichen. Die minimalen Abweichungen zwischen berechneten und gemessenen Werten geben einen ersten Hinweis auf die Genauigkeit der bestimmten Parameter.

Scientific publications on this issue:
[1] C. Laubis, et al. (2006): Characterization of large off-axis EUV mirrors with high accuracy reflectometry at PTB, Proc. SPIE 6151, 61510I.

[2] M. Wurm, B. Bodermann; F. Pilarski (2007): Metrology capabilities and performance of the new DUV scatterometer of the PTB Proc. SPIE 6533 65330H.

[3] R. Model, A. Rathsfeld, H. Groß, M. Wurm, B. Bodermann (2008): A scatterometry inverse problem in optical mask technology. J. Phys., 135, 012071.

[4] Groß, H. Gross, A. Rathsfeld, F. Scholze, M. Bär (2009): Profile reconstruction in EUV scatterometry: Modeling and uncertainty estimates. WIAS Preprint No. 1411(http://www.wias-berlin.de/main/publications/wias-publ/).

[5]
H. Gross, A. Rathsfeld, F. Scholze, R. Model, M. Bär (2008): Computational methods estimating uncertainties for profile reconstruction in scatterometry. Proc. SPIE 6995, 6995OT.

[6] H. Gross, A. Rathsfeld (2008): Sensitivity Analysis for Indirect Measurement in Scatterometry and the Reconstruction of Periodic Grating Structures. Waves in Random and Complex Media, 18, 129.

Contact:
Dr. Hermann Groß, Dr. Markus Bär, PTB Department 8.4 Mathematical Modelling and Data Analysis,
Tel. +4930 3481 7405 and +4930 3481 7687,
e-mails: hermann.gross(at)ptb.de and markus.baer(at)ptb.de

Dr. B. Bodermann, FB 4.2, PTB Department 4.2 Imaging and Wave Optics,
Tel. +40531 592 4222,
e-mail: bernd.bodermann(at)ptb.de

Dr. Frank Scholze, PTB Department 7.2 Radiometry with Synchrotron Radiation ,
Tel. +4930 6392 5094,
e-mail: frank.scholze(at)ptb.de