Extrapolating the actual quantities based on findings: a case for mathematicians
PTB is developing mathematical evaluation methods for the nondestructive measurement of nanostructures
Scientific publications on this issue:
[1] C. Laubis, et al. (2006): Characterization of large off-axis EUV mirrors with high accuracy reflectometry at PTB, Proc. SPIE 6151, 61510I.
[2] M. Wurm, B. Bodermann; F. Pilarski (2007): Metrology capabilities and performance of the new DUV scatterometer of the PTB Proc. SPIE 6533 65330H.
[3] R. Model, A. Rathsfeld, H. Groß, M. Wurm, B. Bodermann (2008): A scatterometry inverse problem in optical mask technology. J. Phys., 135, 012071.
[4] Groß, H. Gross, A. Rathsfeld, F. Scholze, M. Bär (2009): Profile reconstruction in EUV scatterometry: Modeling and uncertainty estimates. WIAS Preprint No. 1411(http://www.wias-berlin.de/main/publications/wias-publ/).
[5] H. Gross, A. Rathsfeld, F. Scholze, R. Model, M. Bär (2008): Computational methods estimating uncertainties for profile reconstruction in scatterometry. Proc. SPIE 6995, 6995OT.
[6] H. Gross, A. Rathsfeld (2008): Sensitivity Analysis for Indirect Measurement in Scatterometry and the Reconstruction of Periodic Grating Structures. Waves in Random and Complex Media, 18, 129.
Contact:
Dr. Hermann Groß, Dr. Markus Bär, PTB Department 8.4 Mathematical Modelling and Data Analysis,
Tel. +4930 3481 7405 and +4930 3481 7687,
e-mails: hermann.gross(at)ptb.de and markus.baer(at)ptb.de
Dr. B. Bodermann, FB 4.2, PTB Department 4.2 Imaging and Wave Optics,
Tel. +40531 592 4222,
e-mail: bernd.bodermann(at)ptb.de
Dr. Frank Scholze, PTB Department 7.2 Radiometry with Synchrotron Radiation ,
Tel. +4930 6392 5094,
e-mail: frank.scholze(at)ptb.de