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CPEM '96 - A world forum for precision metrology - Braunschweig, June 17 to 20, 1996

10.06.1996

Between June 17 and 20, more than 500 scientists from more than 40 countries will meet on the occasion of the Conference on Precision ElectromagneticMeasurements (CPEM). With its 350 papers and poster presentations, this conference is the most important forum for scientists working in the field of precision electromagnetic metrology.

After 1980, in 1996 the CPEM will be held for the second time in Braunschweig. Again it is organized by the Physikalisch-Technische Bundesanstalt (PTB). Venue is the Braunschweig Civic Hall.

For almost 40 years, this biennial conference has proved its outstanding position, and it has again and again tackled new topics and developments.

The ranges of topics discussed in the course of the conference will cover the entire spectrum of precision electromagnetic metrology and extend from electrical measures and fundamental constants to quantum standards and low-temperature electronics to time scales and frequency standards as well as lasers and optoelectronics. In addition, the program will cover practical applications such as a.c. and d.c. measurements, new sensors and automatic measuring systems, microwave techniques, antennas, fields and electromagnetic compatibility.

In the plenary sessions, Klaus von Klitzing, Nobel prize winner, (MPI Stuttgart), Konstantin Likharev (New York State University) and Herbert Walther (MPI Garching) will introduce to the conference topics.

Following the trend of globalization in trade and economy, a panel discussion will take place on the second day, which is to show the present state of the efforts made and suggest approaches to a future worldwide interlinking of metrology. Representatives of metrology organizations which already exist or which are being established, and of the International Bureau of Weights and Measures, will be given the change to speak.

Parallel to the conference there will be a special exhibition at which manufacturers of highly precise measuring instruments will present their latest developments.