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Workshop - Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors

A hybrid workshop on “Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors” will be held on October 11 as part of the NanoScale 2023 conference and participation is free of charge.

The following presentations will be made:

 09:50    The TracOptic-Project - An Overview

10:00    Exemplary Instrument Characterization

10:20    Systematic Performance Deviations of Optical Surface Topography Measuring Instruments

10:40    Scattering Methods for Modelling Optical Surface Topography Measuring Instruments

11:00    Selection of Appropriate Instrumentation and Procedures for Data Evaluation and Uncertainty Estimation

11:20    Discussion

The agenda and abstracts can be found in the attached.

Please join the workshop using this link:

https://teams.microsoft.com/l/meetup-join/19%3ameeting_YmI3ZTE4N2YtOTMyMS00MTA4LTgyYmEtZDY1ZWQ3YzNiMDdm%40thread.v2/0?context=%7b%22Tid%22%3a%22463cf4b2-037b-4a7c-a75c-ae2c1aef241a%22%2c%22Oid%22%3a%220a3556d5-2718-456b-852b-d116844f36f2%22%7d

Links:
intranet.ptb.de/fileadmin/dokumente/intranet/news/veranstaltungen/smithr01/20231011_TracOptic_Stakeholder-Meeting_with_Teams-Link.pdf