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Publikationen

Harren née Hoffmann, Lara:
"Investigating deep ensembles for the tilted-wave interferometer", Dissertation, Technische Universität Berlin, (2022), https://doi.org/10.14279/depositonce-16044.

Scholz, Gregor; Fortmeier, Ines; Marschall, Manuel; Stavridis, Manuel; Schulz, Michael; Elster, Clemens:
"Experimental Design for Virtual Experiments in Tilted-Wave Interferometry", Metrology (2022), 2, 84-97, https://doi.org/10.3390/metrology2010006

Fortmeier, Ines; Stavridis, Manuel; Schulz, Michael; Elster, Clemens:
"Development of a metrological reference system for the form measurement of aspheres and freeform surfaces based on a tilted-wave interferometer", Meas. Sci. Technol., (2022), https://doi.org/10.1088/1361-6501/ac47bd.

Fortmeier, Ines; Schulz, Michael:
"Comparison of form measurement results for optical aspheres and freeform surfaces", Meas. Sci. Technol., (2022), https://doi.org/10.1088/1361-6501/ac47bb.

Hoffmann, Lara; Fortmeier, Ines;  Elster, Clemens:
"Deep learning for tilted-wave interferometry", tm - Technisches Messen (2021), https://doi.org/10.1515/teme-2021-0103.

Hoffmann, Lara; Fortmeier, Ines;  Elster, Clemens:
Uncertainty Quantification by Ensemble Learning for Computational Optical Form Measurements, Mach. Learn.: Sci. Technol., (2021), https://doi.org/10.1088/2632-2153/ac0495.

Hoffmann, Lara; Elster, Clemens:
Deep neural networks for computational optical form measurements, J. Sens. Sens. Syst., 9, 301–307 (2020), https://doi.org/10.5194/jsss-9-301-2020.

Lédl, Vit.; Fortmeier, Ines; Psota, Pavel.; et al.
Influence of mounting on the optical surface figure in optical reference surfaces.
Journal of Instrumentation, 15 (2020), 1-12, doi.org/10.1088/1748-0221/15/01/P01005
IOP Publishing. ISSN 1748-0221

Fortmeier, Ines; Schachtschneider, Reyko; Ledl, Vit; et al.
Round robin comparison study on the form measurement of optical freeform surfaces.
Journal of the European Optical Society: Rapid Publications, 16 (2020), 1-15, doi.org/10.1186/s41476-019-0124-1
Springer. ISSN 1990-2573

Schachtschneider, Reyko; Stavridis, Manuel; Fortmeier, Ines; et al.
SimOptDevice: a library for virtual optical experiments.
Journal of Sensors and Sensor Systems, 8 (2019), 105-110, doi.org/10.5194/jsss-8-105-2019
Copernicus. ISSN 2194-8771 (print); ISSN 2194-878X (online)

Fortmeier, Ines; Schulz, Michael; Meeß, Rudolf:
Traceability of form measurements of freeform surfaces: metrological reference surfaces.
Optical Engineering, 58 (2019), 9, 1-7, doi.org/10.1117/1.OE.58.9.092602
SPIE. ISSN 0091-3286 (print); ISSN 1560-2303 (online)

Schachtschneider, Reyko; Fortmeier, Ines; Stavridis, Manuel; et al.
Interlaboratory comparison measurements of aspheres.
Measurement Science and Technology, 29 (2018), 1-13, dx.doi.org/10.1088/1361-6501/aaae96
IOP Publishing. ISSN 0957-0233 (print); ISSN 1361-6501 (online)

Fortmeier, Ines; Stavridis, Manuel; Elster, Clemens; et.al.
Steps towards traceability for an asphere interferometer.
Optical Measurement Systems for Industrial Inspection X; (Proceedings of SPIE: 10329) (2017), 1032939-1-1032939-9, doi.org/10.1117/12.2269122
Bellingham, Wash.: SPIE.

Blobel, Gernot; Wiegmann, Axel; Siepmann, Jens; et.al.

Metrological multispherical freeform artifact.
Optical Engineering, 55 (2016), 7, 071202-1-071202-8, dx.doi.org/10.1117/1.OE.55.7.071202
SPIE. ISSN 0091-3286

Fortmeier, Ines; Stavridis, Manuel; Wiegmann, Axel; et al.
Evaluation of absolute form measurements using a tilted-wave interferometer.
Optics Express, 24 (2016), 4, 3393-3404, dx.doi.org/10.1364/OE.24.003393
OSA. ISSN 1094-4087 (online)

Fortmeier, Ines:
Zur Optimierung von Auswerteverfahren für Tilted-Wave Interferometer ; (Berichte aus dem Institut für Technische Optik, Institut für Technische Optik, Universität Stuttgart: 82) ; Zugl.: Stuttgart, Univ., Diss., 2016 (2016), XXXVIII, 155 S., http://dx.doi.org/10.18419/opus-8878, nbn-resolving.de/urn:nbn:de:bsz:93-opus-ds-88950
Institut für Technische Optik, Universität Stuttgart.

Fortmeier, Ines; Stavridis, Manuel; Wiegmann, Axel; et al.
Analytical Jacobian and its application to tilted-wave interferometry.
Optics Express, 22 (2014), 18, 13 S., dx.doi.org/10.1364/OE.22.021313
Optical Society of America. ISSN 1094-4087 (online)