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Übersichtsartikel: Quantitative Mikroskopie und dimensionale Nanometrologie

Publikations Einzelansicht

Beitrag zu Tagungsband

Titel: Dimensional micro- and nanometrology at PTB
Autor(en): R. Koening, J. Fluegge, D. Hueser, W. Haessler-Grohne, H.-U. Danzebrink, G. Dai, U. Brand, V. Nesterov, S. Buetefisch, G. Ehret, M. Wurm, B. Bodermann, E. Buhr, H. Bosse
Jahr: 2011
Buchtitel: Measurement 2011 : proceedings of the 8th International Conference on Measurement
Seite(n): 95-106
Veranstaltungsname: Measurement 2011, 8th International Conference on Measurement
Veranstaltungsort: Smolenice, Slovakia
Veranstaltungsdatum: 27-30, April, 2011
ISBN: 978-80-969672-4-7
Zusammenfassung: In this contribution we will provide an overview of the current state and the actually ongoing developments in the field of dimensional micro- and nanometrology at PTB. That is, we will report on the methods and instruments developed, applied and that are in development for high precision, traceable measurements in these important areas of dimensional metrology.

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