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Aktuelles

     

  • Schumacher, Bernd; Sala, Alan
    "Determination of the efficiency of energy harvesters"
    Conference on Precision Electromagnetic Measurements digest,
    2012.
  • Schumacher, Bernd; Sala, Alan
    "Rückführbarkeit der Effizienz von Mikrogeneratoren"
    Messunsicherheit praxisgerecht bestimmen : Erfurt, 8. und 9. November 2011,
    2011.
  • Schumacher, Bernd
    "Final report on EUROMET.EM-K10: Key comparison of resistance standards at 100 Ω"
    Metrologia, 47 (2010), 1A, Tech. Suppl.,
    2010.
  • Melcher, J.; Cain, M.; Bounouh, A.; Cuenat, A.; Jacquot, A.; Manninen, A.; Heinonen, M.; Schumacher, B.; Edler, Frank; Rees, J.; Jaegle, M.; Zucca, M.; Klapetek, P.; Lapuh, R.; Funck, T.
    "The EMRP project metrology for energy harvesting"
    2010 Conference on Precision Electromagnetic Measurements digest, 253-254,
    2010.
  • Schumacher, Bernd; Melcher, Jürgen
    "Automated high-value resistance calibration up to 1 PΩ"
    Conference on Precision Electromagnetic Measurements digest, 635-636,
    2010.
  • Götz, Martin; Drung, Dietmar; Pesel, Eckart; Barthelmess, H.-J.; Hinnrichs, C.; Peters, Margret; Scherer, Hansjörg; Schumacher, Bernd; Schurig, Thomas
    "Improved cryogenic current comparator setup with digital double current source"
    IEEE Transactions on Instrumentation and Measurement, 58, 4, 1176-1182,
    2009.
  • Götz, Martin; Pesel, Eckart; Scherer, Hansjörg; Schumacher, Bernd; Drung, Dietmar; Aßmann, Cornelia; Peters, Margret; Schurig, Thomas; Barthelmess, H.-J.; Hinnrichs, C.
    "Improved cryogenic current comparator setup with digital double current source"
    Conference on Precision Electromagnetic Measurements digest, 264-265,
    2008.
  • Schumacher, Bernd
    "CCEM-K10 comparison of resistance standards at 100 Ω"
    Conference on Precision Electromagnetic Measurements digest, 142-143,
    2008.
  • Schumacher, Bernd
    "Final report on CCEM-K10: Key comparison of resistance standards at 100 Ω"
    Metrologia, 44, Tech. Suppl., 01004,
    2007.
  • Schumacher, Bernd; Drung, Dietmar
    "Cryogenic current comparator without flux transformer"
    Conference on Precision Electromagnetic Measurements digest, 488-489,
    2006.
  • Marullo-Reedtz, Giancarlo; Cerri, Roberto; Waldmann, Wolfgang; Streit, Jiri; Immonen, Pekka; Blanc, Isabelle; Raso, Felix; Funck, Torsten; Schumacher, Bernd; Dierikx, Erik F.; Nunes, Mario; Vrabcek, Peter; Rudohradsky, Dusan; Gunnarsson, Ove; Rydler, Karl-Erik; Jeanneret, Blaise; Jeckelmann, Beat; Pulfer, Thomas; Turhan, Saliha Selcik; Yilmaz, Okan; Williams, Jonathan M.; Slinde, Harald; Lind, Kåre; Nicolas, Jacques; Lindic, Matjaz; Flouda, Eirini; Erdos, Gabor
    "Comparison EUROMET.EM-K8 of dc voltage ratio: results"
    IEEE Transactions on Instrumentation and Measurement, 54, 2, 576-579,
    2005.
  • Marullo-Reedtz, G.; Cerri, R.; Waldmann, W.; Streit, J.; Immonen, P.; Blanc, I.; Raso, F.; Funck, Torsten; Schumacher, Bernd; Dierikx, E.; Nunes, M.; Vrabcek, P.; Rudohradský, D.; Gunnarsson, O.; Jeanneret, B.; Jeckelmann, B.; Pulfer, T.; Selçik Turhan, S.; Yilmaz, O.; Williams, J.; Slinde, H.; Lind, K.; Nicolas, J.; Lindic, M.; Flouda, I.; Erdos, G.
    "Comparison EUROMET.EM-K8 of dc voltage ratio: results"
    Conference on Precision Electromagnetic Measurements Digest, 252-253,
    2004.
  • Hein, Günter; Schumacher, Bernd; Ahlers, Franz Josef
    "Preparation of quantum Hall effect device arrays"
    Conference on Precision Electromagnetic Measurements Digest, 273-274,
    2004.
  • Schumacher, Bernd; Vollmer, Eckhard; Gutmann, Peter
    "Resistance ratio standard with dc-squid detector"
    Conference on Precision Electromagnetic Measurements Digest, 348-349,
    2004.
  • Hall, Michael; Henderson, Lesley; Ashcroft, Gwyn; Harmon, Stuart; Warnecke, Peter; Schumacher, Bernd; Rietveld, Gert
    "Discrepancies between the dc and ac measurement of low frequency electrical conductivity"
    Conference on Precision Electromagnetic Measurements Digest, 34-35,
    2004.
  • Behr, Ralf; Funck, Torsten; Schumacher, Bernd; Warnecke, Peter
    "Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays"
    IEEE Transactions on Instrumentation and Measurement, 52, 2, 521-523,
    2003.
  • Rietveld, G.; Koijmans, Ch. V.; Henderson, L. C. A.; Hall, M. J.; Harmon, S.; Warnecke, Peter; Schumacher, Bernd
    "DC conductivity measurements in the Van der Pauw geometry"
    Conference on Precision Electromagnetic Measurements, 414-415,
    2002.
  • Warnecke, Peter; Behr, Ralf; Funck, Torsten; Schumacher, Bernd
    "Measuring resistance standards in terms of the quantised Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays"
    Conference on Precision Electromagnetic Measurements, 388-389,
    2002.
  • Rietveld, Gerd; Koijmans, Ch. V.; Henderson, Lesley C. A.; Hall, M. J.; Harmon, S.; Warnecke, Peter; Schumacher, Bernd
    "DC conductivity measurements in the Van Der Pauw geometry"
    IEEE Transactions on Instrumentation and Measurement, 52, 2, 449-453,
    2003.
  • Schumacher, Bernd; Warnecke, Peter
    "Do quantum standards have to be validated? The challenge of measurement interoperability"
    NCSL International annual workshop and symposium: Conference proceedings,
    2002.
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