Patent and Technology Offers

Patent and Technology Offers
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Our patent and technology offers are sorted by technology terms and classifications of the International Patent Code (IPC). The technical fields that are assigned to the categories are also explained. For further information about the patent database click here.

Technology Terms

IPC-Class

Year of Patent Application

Metrology for Surfaces

PTB#
(Year)

Titel

Erläuterung

IPC#

0121
(2006)

Robust optical profiler

Plane or nearly plane surfaces are determind with an accuracy of 0,001" or 5 nm/m.

(more...)

G01B

0106
(2005)

Probing Tool of Complex Micro- and Nanostructures

A modified cantilever arm of an atomic force microscope (AFM) is used to determine sub-micrometer gear wheels, drillings or latches.

(more...)

G12B021-002
G01N013-010
G12B0