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Patent and Technology Offers

Patent and Technology Offers
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Our patent and technology offers are sorted by technology terms and classifications of the International Patent Code (IPC). The technical fields that are assigned to the categories are also explained. For further information about the patent database click here.
Technology Terms
IPC-Class
Year of Patent Application
 
Nanotechnology
PTB#
(Year) 		Titel Erläuterung IPC#
0163
(1996) 		Magnetic detection of analytes The magnetic relaxation immunoassay* (MARIA) procedure uses magnetic nanoparticles as markers for probes. By means of purely magnetic methods antibodies can be determined.
*Assay = standardized reaction kinetics
(more...)
G01N
G01R
A61B
0121
(2006) 		Robust optical profiler Plane or nearly plane surfaces are determind with an accuracy of 0,001" or 5 nm/m.
(more...)
G01B
0106
(2005) 		Probing Tool of Complex Micro- and Nanostructures A modified cantilever arm of an atomic force microscope (AFM) is used to determine sub-micrometer gear wheels, drillings or latches.
(more...)
G12B021-002
G01N013-010
G12B0
0100
(2005) 		Ultra precise air bearing A special combination of precision pressure regulation and laminar air flow achieves reproducible table heights of 2 nm during operation.
(more...)
F16C032-006
B23Q001-038
0047
(2002) 		Mechanical and Contactless-Optical Analysis of Object Surfaces Combines an optical with an atomic force microscope (AFM).
(more...)
G12B21-08
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