As a consequence of the implementation of electronics in measurement devices and the strong increase of the number electromagnetic field emitting sources, in particularly in the last 2 decennia, the risk on disturbance of measurement instrumentation by these sources, has increased tremendously.
Successful reduction or elemination of the unacceptable risks for susceptibility was reached during the period mentioned by adoption, worldwide, of EMC immunity requirements in (metrology) legislation. The OIML document D11, being a catalog of state-of-the-art requirements and related test methods on influence quantities, has served as an important help for harmonisation of this implementation in recommendations and the successive legislation.
The further developments in wireless transmission and communication require the revision and updating of D11 on basis of developments and standardisation in the field of EMC.
The presentation will concentrate on these developments. The further focus of the presentation will be on the possible causes of residual susceptibility and the risks for a (deliberate) distortion.