Publications

1. Schödel, R.; Walkov, A.; Abou-Zeid, A.:
   "High accuracy determination of water vapor refractivity by length interferometry"
   Optics Letters 31, 1979 - 1981 (2006)



2. Brand, U.; Schnädelbach, H.; Schödel, R.; Feist, C.; Hinzmann, G.:
   "New depth-setting standards with grooves up to 5 mm depth."
   Proc. of the 6th international conference, European Society for Precision Engineering and Nanotechnology: May 28th - June 1st, 2006, Baden bei Wien, Vienna. Vol. 1, 438 - 441; ISBN 978-0-9553082-0-8 (2006)
   
   
3. Schödel, R.:
   "Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurements"
   Proc. of SPIE 5879, 1-11 (2005)



4. Schödel, R.:
   "Investigation of thermal expansion homogeneity by optical interferometry"
   Proc. of SPIE 5858, 0Q-1 - 0Q-8 (2005)



5. Schödel, R.; Abou-Zeid, A.:
   "PTB’s precision interferometer for high accuracy characterization of thermal expansion properties of low expansion materials", In: Nanoscale calibration standards and methods: dimensional and related measurements in the micro- and nanometer range, Wilkening, G. and Koenders, L., eds.; ISBN 3-527-40502-X; ISBN 978-3-527-40502-2, pp. 500 - 514 (2005)



6. Schödel, R.; Decker, J. E.:
   "Methods to recognize the sample position for most precise interferometric length measurements", Proc. of SPIE, 5532, 237-247 (2004)



7. Schödel, R.; Bönsch, G.:
   "Highest accuracy interferometer alignment by retroreflection scanning", Applied Optics, 43, 5738-5743 (2004)



8. Decker, J. E.; Schödel, R.; Doiron, T.; Bönsch, G.:
   "Phase step calibration extends 19th century standard into 21st", Laser Focus World 5/2004, 143-148 (2004)



9. Decker, J. E.; Schödel, R.; Bönsch, G.:
   "Considerations for the evaluation of measurement uncertainty in interferometric gauge block calibration applying methods of phase step interferometry", Metrologia, 41, L11-L17 (2004)



10. Schödel, R.; Nicolaus, A.; Bönsch, G.:
    "Minimizing interferometer misalignment errors for measurement of sub-nanometer length changes", Proc. of SPIE 5190, 34-42 (2003)



11. Decker, J. E.; Schödel, R.; Bönsch, G.:
    "Next generation Kösters Interferometer", Proc. of SPIE 5190, 14-23 (2003)



12. Schödel, R.; Bönsch, G.:
    "Fortschritte in der interferometrischen Längenmessung zur hochgenauen Bestimmung der Kompressibilität und des thermischen Ausdehnungskoeffizienten", 47. IWK, TU Ilmenau 2002, CD-ROM, ISSN 1619-4098 / Tagungsband, ISSN-Nr. 0943-7207, S. 594-595 (2002)



13. Schödel, R.; Nicolaus, A.; Bönsch, G.:
    "Phase stepping interferometry: Methods to reduce errors caused by camera nonlinearities", Applied Optics, 41, 55-63 (2002)



14. Schödel, R.; Bönsch, G.:
    "Interferometric measurements of thermal expansion, length stability and compressibility of glass ceramics", Proc. of the 3rd euspen 2002, ISBN: 90-386-2883-8, 691-694 (2002)



15. Schödel, R.; Bönsch, G.:
    "Precise interferometric measurements at single crystal silicon yielding thermal expansion coefficients from 12 °C to 28 °C and compressibility", Proc. SPIE Vol 4401, p. 54 - 62 (2001) 



16. Bönsch, G.; Schuster, H. J.; Schödel, R.:
    "Hochgenaue Temperaturmessung mit Thermoelementen", Technisches Messen 68, 550-557 (2001)



17. Bönsch, G.; Potulski, E.:
    "Measurement of the refractive index of air and comparison with modified Edlén's formulae", Metrologia: 35, 133 - 139 (1998)

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