Publications

1. Nicolaus, Arnold R.:
   "Absolute Density Measurements by Interferometrical Diameter Measurements of a Silicon Spehre", Amedeo Avogadro Di Quaregna Meeting, June, 2002, Italy, Proceedings of the Amadeo Avogadro Di Quaregna Meeting, Basile, Guiseppe; Istituto di Metrologia "Gustavo Colonetti", p. 103 - 110 (2006)



2. Nicolaus, A.; Fujii, K.:
   "Primary calibration of the volume of silicon spheres", Measurement Science and Technology, 17, p. 2527 - 2539 (2006)



3. Nicolaus, A.; Bönsch, G.:
   "Absolute Volume Determination of a Silicon Sphere with the Spherical Interferometer of PTB", Metrologia 42, p. 24-31 (2005)



4. Nicolaus, A.; Elster, C.:
   "Diameter determination of Avogadro sphere #1 and #2", IEEE Transactions on Instrumentation and Measurement: ISSN 0018-9456, 54, 2, p. 854 - 859 (2005)



5. Nicolaus, A.; Schulz, M.; Weingärtner, I.:
   "Messung ausgedehnter Wellenfronten mit einem Shack-Hartmann Sensor", DgaO-Proceedings, www.dgao-proceedings.de (2004)



6. Becker, P.; Bettin, H.; Danzebrink, H. U.; Gläser, M.; Kuetgens, U.; Nicolaus, A.; Schiel, D.; de Bièvre, P.; Valkiers, S.; Taylor, P.:
   "Determination of the Avogadro constant via the silicon route", Metrologia 40, p. 271-287 (2003)



7. Nicolaus, A.:
   Proceedings of the Amedeo Avogadro Di Quaregna Meeting: A. Nicolaus "Absolute Density Measurements by Interferometrical Diameter Measurements of a Silicon Sphere", Ed. Guiseppe Basile, Istituto di Metrologia "Gustavo Colonnetti", (2003)



8. Nicolaus, A.; Bönsch, G.:
   "Accurate Measurement of Silicon Spheres by Interferometry", Proceedings of the 3rd euspen International Conference, Vol. 2, p. 545-548, Editors: Delbressine, Schellekens, Homburg, Haitjema; Universiteitsdrukkerij TU Eindhoven, ISBN 90-386-2883-8 (2002)



9. Schödel, R.; Nicolaus, A.; Bönsch, G.:
   "Phase stepping interferometry: Methods to reduce errors caused by camera nonlinearities", Applied Optics, Vol. 41 Nr. 1, p. 55-63 (2002)



10. Weingärtner, I.; Schulz, M.; Geckeler, R. D.; Jusko, O.; Neugebauer, M.; Nicolaus, A.; Bönsch, G.:
    "Tracing back radius of curvature and topography to the base unit of length with ultra-precision", Proc. SPIE 4401, p. 175-183 (2001)



11. Nicolaus, A.; Bönsch, G.; Kang, C.-S.:
    "Interferometrische Kalibrierverfahren für die Schrittweitensteuerung eines Phasenverschiebeinterferometers", Technisches Messen 67, 7-8/2000, S. 328-333 (2000)



12. Nicolaus, A.; Kang, C.-S.; Bönsch, G.:
    "Interferometrische Selbstkalibrierung der Schrittweitenregelung in der Phasenverschiebungsinterferometrie", VDI Berichte 1530: Sensoren und Messsysteme 2000, VDI/VDE-GMA, ISBN 3-18-091530-7, VDI-Verlag GmbH, Düsseldorf, S. 287-296 (2000).



13. Nicolaus, A.; Kang, C.-S.; Bönsch, G.:
    "Double-ended Fizeau interferometers with phase-stepping evaluation for measurements of cubes", Recent Developments in Optical Gauge Block Metrology, Proc. SPIE 3477, p. 109-115 (1998)



14. Bönsch, G.; Nicolaus, A.:
    "Doppelseitige Fizeau-Interferometer mit Phasenverschiebeauswertung für dimensionelle Messungen", Technisches Messen, 3/98, S. 83-90 (1998)



15. Bönsch, G.:
    "Fit of Edlén's formulae to measured values of the refractive index of air" Proc. SPIE 3477, p. 62-66 (1998)



16. Bönsch, G.; Potulski, E.:
    "Measurement of the refractive index of air and comparison with modified Edlen's formulae", Metrologia 35, p. 133-139 (1998)



17. Nicolaus, A.; Bönsch, G.:
    "A Novel Interferometer for Dimensional Measurement of a Silicon Sphere", IEEE Trans. Instrum. Meas., Vol. 46, p. 563-565 (1997)



18. Becker, P.; Bettin, H.; Koenders, L.; Martin, J.; Nicolaus, A.; Röttger, S.:
    "The silicon path to the kilogram", PTB-Mitteilungen 106, 5/96, 321-329 (1996)



19. Nicolaus, A.:
    PTB-OPT-41: "Auswertung von Fizeau-Interferenzen mit Hilfe der Phasenverschiebungsinterferometrie", ISBN 389429-391-8, S. 132 (1993)



20. A. Nicolaus:
    "Precise method to determining systematic errors in phase-shifting interferometry on Fizeau interferences", Appl. Opt., Vol. 32 Nr. 31, p. 6380-6386 (1993)



21. Nicolaus, A.:
    "Optical testing by Fizeau phase-shifting interferometry", "From Galileo´s ´occhialino´ to optoelectronics", Paolo Mazzoldi Ed., World Scientific Publishing Co. Pte. Ltd., Singapore, New Jersey, London, Hong Kong, ISBN 981-02-1332-8, p. 572-577 (1993)



22. Nicolaus, A.:
    "Evaluation of Fizeau interferences by phase-shifting interferometry", Optik 87, p. 23-26 (1991)



23. Nicolaus, A.:
    "Evaluation of Fizeau interferences: a comparison of phase-stepping-algorithms", Optics in complex systems, Lanzl, Preuss, Weigelt Editors, Proc. SPIE 1319, p. 237-238 (1990)



24. Bönsch, G.; Böhme, H.:
    "Phase-determination of Fizeau interferences by phase-shifting interferometry", Optik 82, p. 161-164 (1989)



25. Bönsch, G.; Brand, U.; Helmcke, J.; Nicolaus, A.; Riehle, F.:
    "Realisierung der Längeneinheit mit Laserwellenlängennormalen der PTB", PTB-Mitteilungen 99, 1/89 (1989)

---

© Physikalisch-Technische Bundesanstalt Page created: 26-Sep-2006, last update: 26-Feb-2008 10:32 AM, K. Eggert