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Arbeitsgruppe 5.24
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Modeling Scanning Microscopy
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Research Items |
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Staff/Contact |
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Research Items
- Monte Carlo methods for simulation of image formation in SEM
- New development of a modular Monte Carlo simulation software
- Procedures for tip reconstruction in scanning probe microscopy
- Modeling of probe sample interaction in scanning probe microscopy
- FEM and AFM methods for characterization of nano particles
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© Physikalisch-Technische Bundesanstalt
Page created: 2008-04-16, last update: 2008-04-16, Dorothee Hüser
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